AbstractIn this paper, we proposed a new optical Mura compensation method that requires only a few Mura detections for all gray levels. We analyzed the characteristics of Mura resulting from process variations in the thin film transistor (TFT) of each pixel and developed a new model using a logarithmic function. The proposed compensation algorithm has been verified with simulation and experimental results. We found that the uniformity of the proposed compensation algorithm at 7G, 24G, 75G, 100G, 150G, and 255G, which required only two image captures, was comparable to those that required five captures. The model improved uniformity from 41.32% to 68.60% at 0.18 nit brightness, demonstrating its effectiveness. Additionally, the method significantly reduces the number of image captures needed from five to two and decreases the image capturing process time from 2183 to 150 ms, saving over 14 times in process efficiency. The proposed methodology demonstrates significant advancements in achieving luminance uniformity in OLED displays, addressing mass production constraints.
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