Proposed Bandgap Reference Circuit Research Articles

A 10.5 ppm/°C Modified Sub-1 V Bandgap in 28 nm CMOS Technology with Only Two Operating Points

Reference voltage/current generation is essential to the Analog circuit design. There have been several ways to generate quality reference voltage using bandgap reference (BGR) and there are mainly two types: current mode and voltage mode. The current-mode bandgap reference (CBGR) is widely accepted in industry due to having an output voltage which is below 1 V. However, its drawbacks include a lack of proportional to absolute temperature (PTAT) current availability, a large silicon area, multiple operating points, and a large temperature coefficient (TC). In this paper, various operating points are explained in detail with diagrams. Similar to the conventional voltage mode bandgap reference (VBGR) circuits, modifications of the existing circuits with only two operating points have also been proposed. Moreover, the proposed BGR occupies a much smaller area due to eliminating the complimentary to absolute temperature (CTAT) current-generating resistor. A new self-biased opamp was introduced to operate from a 1.05 V supply, reducing systematic offset and TC of the BGR. The proposed solution has been implemented in 28 nm CMOS TSMC technology, and extraction simulations were performed to prove the robustness of the proposed circuit. The targeted mean BGR output is 500 mV, and across the industrial temperature range (−40 to 125 °C), the simulated TC is approximately 10.5 ppm/°C. The integrated output noise within the observable frequency band is 19.6 µV (rms). A 200-point Monte Carlo simulation displays a histogram with a 2.6 mV accuracy of 1.2% (±3-sigma). The proposed BGR circuit consumes 32.8 µW of power from a 1.05 V supply in a fast process and hot (125 °C) corner. It occupies a silicon area of 81 × 42 µm (including capacitors). This design can aim for use in biomedical and sensor applications.

A High-Precision Current-Mode Bandgap Reference with Nonlinear Temperature Compensation.

A high-precision current-mode bandgap reference (BGR) circuit with a high-order temperature compensation is presented in this paper. In order to achieve a high-precision BGR circuit, the equation of the nonlinear current has been modified and the high-order term of the current flowing into the nonlinear compensation bipolar junction transistor (NLCBJT) is compensated further. According to the modified equation, two solutions are designed to improve the output accuracy of BGR circuits. The first solution is to divide the NLCBJT branch into two branches to reduce the coefficient of the nonlinear temperature compensation current. The second solution is to inject the nonlinear current into the two branches based on the first one to further eliminate the temperature coefficient (TC) of the current flowing into the NLCBJT. The proposed BGR circuit has been designed using the Semiconductor Manufacturing International Corporation (SMIC) 55 nm CMOS process. The simulation results show that the variations in currents flowing into NLCBJTs improved from 148.41 nA to 69.35 nA and 7.4 nA, respectively, the TC of the output reference current of the proposed circuit is approximately 3.78 ppm/°C at a temperature range of -50 °C to 120 °C with a supply voltage of 3.3 V, the quiescent current consumption of the entire BGR circuit is 42.13 μA, and the size of the BGR layout is 0.044 mm2, leading to the development of a high-precision BGR circuit.

A 2.6 ppm/°C 2.5 V Piece-Wise Compensated Bandgap Reference with Low Beta Bipolar

Traditional bandgap reference (BGR) is sensitive to process variation and is not suitable for mass production. Consequently, a stacked piece-wise compensated bandgap reference (SPWBGR) with low beta bipolar is proposed, designed and fabricated in the 0.18 μm high-voltage (HV) BCD process. Two stacked BGR (SBGR) cores make up the proposed BGR circuit. Through setting the target reference voltage near the output voltage of SBGR cores, the feedback resistor ratio is reduced and the base current side-effect is significantly decreased. Notably, the SBGR core is implemented by the low beta npn bipolar and it relaxes the requirement for the high beta bipolar. The two SBGR cores are almost identical except for the temperature slope and feedback ratio. The two cores have different zero temperature coefficient (TC) points, one is set at −5 °C, and the other is set at 60 °C, named as SBGRA and SBGRB, respectively. The SBGRA and SBGRB output the same voltage at their zero TC point. The higher voltage of SBGRA and SBGRB is the output voltage. Through the process of tracking the maximum value of different SBGR cores, the proposed SPWBGR achieves 2.6 ppm/°C TC from −40 to 100 °C. As a result, the average TC for five random samples is 5.3 ppm/°C. The line regulation is 2 mV/V from 4.5 to 5.5 V power supply. The current consumption is 6.8 µA. The active area of the proposed BGR is 0.075 mm2.

A 1.2-V 4.2-<formula formulatype="inline"> <tex Notation="TeX">$\hbox{ppm}/^{\circ}\hbox{C}$</tex></formula> High-Order Curvature-Compensated CMOS Bandgap Reference

This study presents a high-precision CMOS bandgap reference (BGR) circuit with low supply voltage. The proposed BGR circuit consists of two BGR cores and a curvature correction circuit, which includes a current mirror and a summing circuit. Two BGR cores adopt conventional structures with the curvature-down characteristics. A current-mirror circuit is proposed to implement one of the BGR cores to have the curvature-up characteristic. Selection of the appropriate resistances in the BGR cores results in one reference voltage with a well balanced curvature-down characteristic and another reference voltage with an evenly balanced curvature-up characteristic. The summation of these reference voltages is proposed to achieve a high-order curvature compensation. This curvature correction circuit causes the proposed BGR circuit without any trimming to show a measured temperature coefficient (TC) as low as 4.2 ppm/°C over a wide temperature range of 160 °C (-40 ~ 120 °C) at a power supply voltage of 1.2 V. The average TC for 8 random samples is approximately 9.3 ppm/°C. The measured power-supply rejection ratio (PSRR) of -30 dB is achieved at the frequency of 100 kHz. The total chip size is 0.063 mm 2 with a standard 0.13-μm CMOS process.

A low‐voltage band‐gap reference circuit with second‐order analyses

AbstractA new band‐gap reference (BGR) circuit employing sub‐threshold current is proposed for low‐voltage operations. By employing the fraction of VBE and the sub‐threshold current source, the proposed BGR circuit with chip area of 0.029mm2 was fabricated in the standard 0.18µm CMOS triple‐well technology. It generates reference voltage of 170 mV with power consumption of 2.4µW at supply voltage of 1 V. The agreement between simulation and measurement shows that the variations of reference voltage are 1.3 mV for temperatures from −20 to 100∘C, and 1.1 mV per volt for supply voltage from 0.95 to 2.5 V, respectively. Copyright © 2010 John Wiley & Sons, Ltd.

A CMOS bandgap reference circuit with sub-1-V operation

This paper proposes a CMOS bandgap reference (BGR) circuit, which can successfully operate with sub-1-V supply, In the conventional BGR circuit, the output voltage V/sub ref/ is the sum of the built-in voltage of the diode V/sub f/ and the thermal voltage V/sub T/ of kT/q multiplied by a constant. Therefore, V/sub ref/ is about 1.25 V, which limits a low supply-voltage operation below 1 V. Conversely, in the proposed BGR circuit, V/sub ref/ has been converted from the sum of two currents; one is proportional to V/sub f/ and the other is proportional to V/sub T/. An experimental BGR circuit, which is simply composed of a CMOS op-amp, diodes, and resistors, has been fabricated in a conventional 0.4-/spl mu/m flash memory process. Measured V/sub ref/ is 518/spl plusmn/15 mV (3/spl sigma/) for 23 samples on the same wafer at 27-125/spl deg/C.