A new analytical technique for trace element analysis has been developed based on isotope dilution and on the use of an ion probe. It allows the determination of concentrations at the ppm level with a precision of a few percent. The chemical procedure involves dissolution, spiking of the sample and separation of groups of trace elements. The samples are subsequently loaded on a silicon substrate, and a programmable motion of the sample holder in the ion probe allows a routine analysis of around 80 loads per “run”, which corresponds to 15 elemental concentrations (REE, Li, K, Rb, Sr, Ba) on 10 different samples. Various parameters influencing the precision of the technique have been tested. The precision and the swiftness of the technique have allowed us to easily test its reproducibility. From a sample of tholeiitic basalt, split in ten fractions after dissolution, the total variation of the concentrations are ±1.5% for Sr, 2% for the REE, 4% for Ba and Rb, and 10% for Li.