A precise method is presented for measuring the refractive index of an anisotropic prism with light polarized orthogonal to the prism axis which is also a dielectric axis. Prisms have been cut from crystals of the optically nonlinear 4-amino benzophenone with exceptionally low defect concentration as identified by synchrotron white light topography. The linear refractive indices of these have been measured and fitted to four-parameter Sellmeier equations to an accuracy of 7×10−6–3×10−3. The values are accurately verified by observation of the external angle of incidence to a (001) plane required to meet the conditions of type-I phase matching with a fundamental wavelength of 1064 nm. The phase matching is of Hobden class six for this wavelength. In common with similar organic molecular materials, the molecular charge transfer axis defines the most polarizable direction in the crystal, with the C=O direction being much less significant.