Primary Electron Beam Research Articles

On the VHE Spectrum and Formation of the Teraelectronvolt Pulsed Emission of the Crab Pulsar

In the present paper, a model for the pulsed γ-ray emission of the Crab pulsar from 0.01 GeV to 1 TeV in the context of synchrotron emission generated in the vicinity of a light cylinder is developed. The generation of such high energies through the synchrotron process requires the existence of very energetic plasma particles in pulsar magnetospheres. It is assumed that the emitting particles are ultra-relativistic primary beam electrons re-accelerated to very high energies due to the Landau damping process of a special type of parametrically driven Langmuir waves. This type of Langmuir wave carries energy released through the rotational slow-down of a pulsar and is very effective in supplying the resonant particles with energy from a natural reservoir. The model provides simultaneous generation of energetic γ-ray and low-frequency radio (0.1–1 GHz) emission in the same location of the pulsar magnetosphere. These two radiations processes are triggered by a single plasma process, namely excitation of the cyclotron instability. This provides a natural explanation for the observed coincidence of radio and γ-ray signals observed from the Crab pulsar.

Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL

We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector side detector is to measure the electrons back-streaming from the collector or the downstream electrodes to the cathode. It is important to understand how the back-streaming electrons behave and how to control it. The detector was designed with considerations of heat load. The influence on the electric potential distribution was investigated. A detector test showed that the back-streaming electrons were affected by the external electromagnetic fields and the space charge of the primary electron beam. It was proved that the behaviour of the electrons can be observed by this detector.

High Resolution Powder Electron Diffraction in Scanning Electron Microscopy.

A modern scanning electron microscope equipped with a pixelated detector of transmitted electrons can record a four-dimensional (4D) dataset containing a two-dimensional (2D) array of 2D nanobeam electron diffraction patterns; this is known as a four-dimensional scanning transmission electron microscopy (4D-STEM). In this work, we introduce a new version of our method called 4D-STEM/PNBD (powder nanobeam diffraction), which yields high-resolution powder diffractograms, whose quality is fully comparable to standard TEM/SAED (selected-area electron diffraction) patterns. Our method converts a complex 4D-STEM dataset measured on a nanocrystalline material to a single 2D powder electron diffractogram, which is easy to process with standard software. The original version of 4D-STEM/PNBD method, which suffered from low resolution, was improved in three important areas: (i) an optimized data collection protocol enables the experimental determination of the point spread function (PSF) of the primary electron beam, (ii) an improved data processing combines an entropy-based filtering of the whole dataset with a PSF-deconvolution of the individual 2D diffractograms and (iii) completely re-written software automates all calculations and requires just a minimal user input. The new method was applied to Au, TbF3 and TiO2 nanocrystals and the resolution of the 4D-STEM/PNBD diffractograms was even slightly better than that of TEM/SAED.

SECONDARY ELECTRON EMISSION FROM THIN ALUMINIUM FOILS PRODUCED BY HIGH ENERGY ELECTRON BEAMS

The description of the experimental equipment and technique for measuring the secondary emission of elec-trons (SEE) with application of accelerated electrons at the linear accelerator of the IHEPNP NSC KIPT with ener-gies up to 30 MeV and a standard secondary emission monitor [1] are presented. Experimental data of secondary electron emission yields from thin aluminum targets (8 and 50 μm) for primary electron beam energies of 16 and 25 MeV have been experimentally measured. The analysis of the experimental data and their comparison with the theory are carried out. It is shown that the proposed technique for measuring the yields of secondary electron emis-sion is useful and applied for study of low-energy and δ-electrons yields from thin foils, as well as to research the effect of the density effect depending on the energy of the primary electron beam.

FORMATION AND MONITORING OF SECONDARY X-RAY RADIATION UNDER PRODUCT PROCESSING WITH ELECTRON BEAM

When conducting an industrial radiation processes at an electron accelerator, a part of the beam energy is trans-formed into bremsstrahlung radiation. In such a way, the mixed e,X-radiation is formed in the area behind an irra-diated object. The intensity of the electron and photon components in the radiation is determined by the energy and power of the primary electron beam, as well as by the parameters of the object and devices located behind it. In paper, the characteristics of the e,X-radiation accompanying the product processing by a scanning electron beam with energy 8…12 MeV at a LU-10 Linac of NSC KIPT are studied. The conditions for obtaining a source of sec-ondary X-rays in the state of electronic equilibrium, as well as its monitoring using an extended free-air ionization chamber are explored. Such an extra-source of radiation can be used for carrying out various non-commercial pro-grams like radiation tests, sanitization of archival materials and cultural heritage objects, etc.

Multiple criteria optimization of electrostatic electron lenses using multiobjective genetic algorithms

The design of an electrostatic electron optical system with five electrodes and two objective functions is optimized using multiobjective genetic algorithms (MOGAs) optimization. The two objective functions considered are minimum probe size of the primary electron beam in a fixed image plane and maximum secondary electron detection efficiency at an in-lens detector plane. The time-consuming step is the calculation of the system potential. There are two methods to do this. The first is using COMSOL (finite element method) and the second is using the second-order electrode method (SOEM). The former makes the optimization process very slow but accurate, and the latter makes it fast but less accurate. A fully automated optimization strategy is presented, where a SOEM-based MOGA provides input systems for a COMSOL-based MOGA. This boosts the optimization process and reduces the optimization times by at least ∼10 times, from several days to a few hours. A typical optimized system has a probe size of 11.9 nm and a secondary electron detection efficiency of 80%. This new method can be implemented in electrostatic lens design with one or more objective functions and multiple free variables as a very efficient, fully automated optimization technique.

Application of Prandtl's Theory in the Design of an Experimental Chamber for Static Pressure Measurements.

Pumping in vacuum chambers is part of the field of environmental electron microscopy. These chambers are separated from each other by a small-diameter aperture that creates a critical flow in the supersonic flow regime. The distribution of pressure and shock waves in the path of the primary electron beam passing through the differentially pumped chamber has a large influence on the quality of the resulting microscope image. As part of this research, an experimental chamber was constructed to map supersonic flow at low pressures. The shape of this chamber was designed using mathematical–physical analyses, which served not only as a basis for the design of its geometry, but especially for the correct choice of absolute and differential pressure sensors with respect to the cryogenic temperature generated in the supersonic flow. The mathematical and physical analyses presented here map the nature of the supersonic flow with large gradients of state variables at low pressures at the continuum mechanics boundary near the region of free molecule motion in which the Environmental Electron Microscope and its differentially pumped chamber operate, which has a significant impact on the resulting sharpness of the final image obtained by the microscope. The results of this work map the flow in and behind the Laval nozzle in the experimental chamber and are the initial basis that enabled the optimization of the design of the chamber based on Prandtl’s theory for the possibility of fitting it with pressure probes in such a way that they can map the flow in and behind the Laval nozzle.

Shape evolution and growth mechanisms of 3D-printed nanowires

3D printing of nanowires using Focused Electron Beam Induced Deposition (FEBID) enables the direct-write fabrication of complex 3D objects on almost any substrate surface. The physical properties of such freestanding structures are determined by the dimensions of constituent nanowires. However, little knowledge is available about the exact shape of the nanowires, which is indispensable for calculations and simulations as well as for optimization in applications. In this study, we evaluate the thicknesses and widths of freestanding segments as a function of the inclination angles, primary electron energy, beam currents, and precursor flux. Furthermore, the cross-sectional shape, the cross-sectional area, and the evolution along the length of the wire are investigated. Basing on detailed scanning electron microscopy measurements and Monte Carlo/Finite Differences simulations, the effects that the growth parameters have on the segment growth are elucidated. The results shed light on the growth evolution of the structures and form the basis for future studies on the fabrication of high-precision, arbitrarily shaped nanowires.

Electron and Photon Energy Spectra Outside of 6 MV X-ray Small Radiotherapy Field Edges Produced by a Varian iX Linac

Due to the increase in the survival probability for patients treated with modern radiotherapy techniques to live enough for experimenting the late radiation effect, low dose outside the treatment volume becomes a concern. However, besides the absorbed dose, the beam quality outside the field edge should be taken into account. This work aimed at investigating the photon and electron fluence spectra outside the field edges for several small radiotherapy fields for determining the quality of the beams in order to better evaluate the secondary effect after modern radiotherapy treatments. Phase-space files of a 6 MV X-ray beam produced by a Varian iX linac for eight small fields of 0.7 × 0.7 cm2, 0.9 × 0.9 cm2, 1.8 × 1.8 cm2, 2.2 × 2.2 cm2, 2.7 × 2.7 cm2, 3.1 × 3.1 cm2, 3.6 × 3.6 cm2, and 4.5 × 4.5 cm2 and for the reference 10 × 10 cm2 field at SSD = 100 cm were generated using the BEAMnrc code. The photon and electron fluences in each field were calculated at 0.15, 1.35, and 9.85 cm water depth and several off-axis distances using FLURZnrc. The number of low-energy electrons between 1 and 10 keV at 2 cm outside the field edge increases by 60% compared to the central axis. Due to the relatively high linear energy transfer (LET) of these electrons, the results of this work should help to better evaluate the possible late effect of secondary radiation on healthy organs close to the tumor volume after radiotherapy treatment. We also observed high-energy electrons outside the field edge that are attributed to the leakage of the primary electron beam from the head of the linac. From a standpoint of radiological protection, these electrons should be taken into account when evaluating the dose delivered to the patient’s skin.

Critical-dimension scanning electron microscope characterization of smoothly varying wave structures with a Monte Carlo simulation

Scanning electron microscopy (SEM) characterization of a smoothly varying nanograting structure (a Pt-coated Cr grid on a Si substrate) with a sinusoidal waveform has been carried out by a Monte Carlo (MC) simulation technique. Previous studies with critical-dimension (CD) SEM (CD-SEM) have mostly concerned line structures with sharp edges so that there is an obvious edge bloom in the linescan profile of secondary electrons. In contrast, the present grating structures prepared by a laser-focused atomic deposition technique have a smoothly varying waveform in the cross-sectional profile, which pose greater difficulty for quantitative structural characterization by SEM. The grating structure, with a fixed pitch of λ/2 as the period of the standing-wave laser light field, where λ is the wavelength of the corresponding laser light, can be used as an ideal nanoscale metrological length tool; therefore, it is important to characterize its structural features over a large deposited area by SEM imaging for quality control, with the aim of mass reproduction. The present work extends the CD characterization of MC simulation methods to more complex structures. Taking into account different experimental factors, i.e. primary electron beam parameters, geometrical parameters and material properties, the unknown geometrical parameters (i.e. base height, peak height, linewidth shrinkage and peak tilt angle) of the grating lines have been successfully extracted from the experimental linescan profiles of SEM images.

DeepBeam: a machine learning framework for tuning the primary electron beam of the PRIMO Monte Carlo software

BackgroundAny Monte Carlo simulation of dose delivery using medical accelerator-generated megavolt photon beams begins by simulating electrons of the primary electron beam interacting with a target. Because the electron beam characteristics of any single accelerator are unique and generally unknown, an appropriate model of an electron beam must be assumed before MC simulations can be run. The purpose of the present study is to develop a flexible framework with suitable regression models for estimating parameters of the model of primary electron beam in simulators of medical linear accelerators using real reference dose profiles measured in a water phantom.MethodsAll simulations were run using PRIMO MC simulator. Two regression models for estimating the parameters of the simulated primary electron beam, both based on machine learning, were developed. The first model applies Principal Component Analysis to measured dose profiles in order to extract principal features of the shapes of the these profiles. The PCA-obtained features are then used by Support Vector Regressors to estimate the parameters of the model of the electron beam. The second model, based on deep learning, consists of a set of encoders processing measured dose profiles, followed by a sequence of fully connected layers acting together, which solve the regression problem of estimating values of the electron beam parameters directly from the measured dose profiles. Results of the regression are then used to reconstruct the dose profiles based on the PCA model. Agreement between the measured and reconstructed profiles can be further improved by an optimization procedure resulting in the final estimates of the parameters of the model of the primary electron beam. These final estimates are then used to determine dose profiles in MC simulations.ResultsAnalysed were a set of actually measured (real) dose profiles of 6 MV beams from a real Varian 2300 C/D accelerator, a set of simulated training profiles, and a separate set of simulated testing profiles, both generated for a range of parameters of the primary electron beam of the Varian 2300 C/D PRIMO simulator. Application of the two-stage procedure based on regression followed by reconstruction-based minimization of the difference between measured (real) and reconstructed profiles resulted in achieving consistent estimates of electron beam parameters and in a very good agreement between the measured and simulated photon beam profiles.ConclusionsThe proposed framework is a readily applicable and customizable tool which may be applied in tuning virtual primary electron beams of Monte Carlo simulators of linear accelerators. The codes, training and test data, together with readout procedures, are freely available at the site: https://github.com/taborzbislaw/DeepBeam.

Exploring the heat transfer for spherical nanoparticles under electron irradiation

To explore the thermal effect of an electron beam irradiation during a scanning electron microscope (SEM) imaging process, a Monte Carlo (MC) method has been used to calculate the spatial distributions of local temperature rise in a spherical gold (Au) nanoparticle (i.e. Au Nano sphere (Au-NS)). The influencesofthe size of the nanoparticle, incident angle of the primary electron (PE) beam, PE energy and the PE beam size on the heat generation were systematically investigated. First of all, this work verified that Au-NSs with various sizes present different heat capacities under the same condition of the electron irradiation. The smaller the sphere, the less heat is accumulated. Besides, the heat in the periphery of a relatively large Au-NS is less than that inside. As the incident angle increases, the distribution regions of the temperature rise gradually expand from the contact surface deep into the interior and its amount rises proportionately. This rule is the same for an Au-NS with the diameter of 40 nm under various PE energies, but is quite opposite for the case of an Au-NS with the diameter of 5 nm. This study next presents that the PE beam size affects the heat generation in a spherical Au nanoparticle significantly. The distribution of temperature rise specifically shows a gradually reduced intensity towards the larger PE beam size. In addition, this work found that the total electron (TE) line-scan profile inversely relates the temperature contour map. The underlying mechanisms of these results were explained in detail primarily with the analysis of the trajectory of electrons as well as the interaction of electron-solid. This work, on the one side, greatly benefits the study of the relationship between the sample structures and the local thermal effect under the electron irradiation. On the other side, this work provides a further understanding and elucidation of the mechanism of electron-beam-induced deposition, compared to those earlier reports only focusing on plane bulks. It is believed that the proceeding of the semiconductor industry would be significantly promoted by this study.

Detailed Monte Carlo analysis of the secondary photons coming out of the therapeutic X-ray beam of linear accelerator

Abstract External photon beam radiotherapy is often used in tumor treatment. The photons are generated from the target which had stricken by the primary electron beam (incident particles). The photon beam contains the primary photons coming directly from the target and secondary photons coming from the photon interactions with head component materials (scattered photons). Altogether is thereafter used in radiotherapy treatment. This Monte Carlo study aims to investigate and evaluate the secondary radiations (photons) in terms of fluence, energy fluence, spectral distribution, mean energy and angular spread distribution. The secondary photons, which contributed in radiotherapy treatment, are examined and evaluated in number (fluence) and energy. At the phantom surface, the secondary photons originated in the whole linac head are mainly coming from the primary collimator. In 0.45% of secondary photons coming from the whole linac head, the primary collimator contributes by 86% and they are more energetic. However, the flattening filter and the secondary collimator contribute together by less than 14% and their photons are less energetic and then can deteriorate the beam dosimetry quality. To improve the radiotherapy treatment quality, the number of photons of low energy should be as low as possible in the clinical beam. Our work can be a basic investigation to use in the improvement of linac head configuration and specially the beam modifiers.

Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy

The damage-induced voltage alteration (DIVA) contrast mechanism in scanning electron microscope (SEM) has been studied in broad range of the primary electron beam energies, with a special emphasis on the ultra-low energy range. The SEM imaging contrast related to resistivity changes in the In(0.55)Al(0.45)P irradiated with He2+ ions of 600 keV was subjected to an analysis in a range of 10 keV down to 10 eV of primary electron energies. The problem of specimen charging in ultra-low energy range and its effect on the contrast in SEM images has been tackled for the first time. Contrary to expectations based on the classical total emission yield approach, the potentials formed at the highly resistive part of irradiated area led to dramatic increase in the intensity of registered signal for primary electron energies below E1, which can be explained as signal saturation due to potential on the specimen surface acting as repeller for primary electrons. Nevertheless, the experimental data presenting the influence of the beam energy on the potential formation on the surface of an insulating material under electron irradiation have been presented for the first time in ultra-low energy regime.

Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM

Scanning Electron Microscopy (SEM) technique is widely used to characterize nanoparticle (NP) size. The landing energy (LE) of the primary electron beam is considered to be a key parameter related to the ability of electrons to penetrate the sample. However, few studies have been carried out so far on the influence of this parameter on the measurement of NP size by SEM. The increasing needs for reference materials consisting of size-controlled NP suspension for microscope calibration induce new issues. This paper focuses on the effect of electron landing energy on the measurement of the equivalent diameter of several NP populations by SEM. To evaluate the influence of LE, particles of different sizes and chemical compositions were analyzed. The results showed the variation of the measured diameter as a function of LE. SEM secondary electron (SE) yield modeling by the Monte Carlo method allowed us to relate this variation to the information volume in the material. Finally, the use of reference particles and transmission electron microscopy (TEM) allowed us to determine an optimal value of LE to be applied, depending on the chemical composition and particle size to limit the bias in the SEM measurement. We showed that this operating point can be simply determined without reference nanomaterials by scanning an LE range.

Small accelerators and their applications in the CANAM research infrastructure at the NPI CAS

The Nuclear Physics Institute (NPI) of the Czech Academy of Sciences (CAS) operates, among other facilities, a Tandetron linear accelerator, TR-24 and U-120M cyclotrons, and an MT25 microtron. A new accelerator mass spectrometry (AMS) instrument, MILEA, has recently been acquired. Except for the MT25, all facilities are synergic parts of the Centre of Accelerators and Nuclear Analytical Methods Research Infrastructure (CANAM RI) ( http://canam.ujf.cas.cz ). This paper demonstrates the instrumental, scientific and application capabilities of the devices for many fundamental nuclear physics experiments and a wide spectrum of applications. The Tandetron Laboratory has a full arsenal of ion-beam analytical methods, ion-beam nano- and microstructuring techniques, as well as tools for the doping and synthesis of new progressive materials using energetic ion beams. It uniquely utilises ion beams for 3D elemental mapping; it studies internal morphology using ion-microprobe methods applicable in many scientific branches. The TR-24 and U-120M cyclotrons provide the primary beams of accelerated ions as well as the generated secondary fast neutrons, including the necessary instrumentation and the target technology, and enable fundamental experiments in nuclear physics, astrophysics, dosimetry, etc. The microtron MT25 is a source of relativistic electrons (the primary electron beam), the secondary photon beam (bremsstrahlung) and neutrons from photonuclear reactions which are used, e.g. for analysis and preservation of cultural heritage. The MILEA AMS system offers a highly sensitive isotopic ratio measurement of very long-lived radionuclides at levels up to 10–15.

Electron pair emission from surfaces: Photon versus electron excitation

We have studied the electron pair emission process from a Cu(111) surface excited by a primary electron or photon beam. Although the photon energy was 30 eV the primary electron beam had an energy of 25 eV. We will discuss the energy and momentum distributions. The experiments with the electron beam demonstrate that the contributions from the Shockley surface state can be clearly identified. This is not the case for the work with photons which we ascribe to the low spectral weight of the contribution from two Shockley state electrons compared to two $3d$ electrons. The momentum distributions reveal a close similarity between the two types of excitation despite the fact that the microscopic origin of the pair emission is very different. There is a distinctive energy dependence of these curves which we describe by an empirical three-parameter polynomial. The numerical values of these parameters are close for both pathways. Additional measurements with different primary electron energies reveals the importance of the initial state on the momentum distributions.

On the fate of high-resolution electron energy loss spectroscopy (HREELS), a versatile probe to detect surface excitations: will the Phoenix rise again?

From its advent, high-resolution electron energy loss spectroscopy (HREELS) has emerged as one of the most versatile tools in surface science. In the last few decades, HREELS was widely used for the fundamental study of (i) chemical reactions at the surfaces of model catalysts (mostly single crystals), (ii) lattice dynamics (phonons), (iii) surface plasmons and (iv) magnons. However, HREELS has experienced a continuous decay of the number of daily users worldwide so far, due to several factors. However, the rise of Dirac materials (graphene, topological insulators, Dirac semimetals) offers new perspectives for HREELS, due to its unique features enabling ultrasensitive detection of (i) chemical modifications at their surfaces, (ii) Kohn anomalies arising from electron-phonon coupling and (iii) novel plasmonic excitations associated to Dirac-cone fermions, as well as their eventual mutual interplay with other plasmon resonances related to topologically trivial electronic states. By selected case-study examples, here we show that HREELS can uniquely probe these phenomena in Dirac materials, thus validating its outstanding relevance and its irreplaceability in contemporary solid-state physics, thus paving the way for a renewed interest. In addition, recent technological upgrades enable the combination of HREELS as an add-on to photoemission apparatuses for parallel readout of energy and momentum of surface excitations. Open issues for theoretical modelling of HREELS related to the dependence on primary electron beam energy and scattering geometry are also critically presented.

Exploring the temperature rise under low-energy electron irradiation for various materials

Scanning electron microscope (SEM) is frequently-used in analysis for micro/nanoscale structural information. During SEM analysis, besides the widely-known charging effect, the temperature rise because of electron beam bombardment has become an issue due to it also can modify SEM results with the downsizing of specimen. In this work, a sophisticated Monte Carlo (MC) model which considered the cascade electron production was adopted to quantitatively study the temperature rise during SEM imaging. The rule of temperature profile was explored focusing on four different materials (semi-infinite beryllium (Be), magnesium (Mg), copper (Cu) and gold (Au) bulks) and primary electron (PE) beam energies. It was concluded that the temperature profile presents three main characteristics: a) increasing first at surface until its maximum is reached, then has a sharp reduction as a function of depth from the surface for all materials; b) being affected seriously by PE energy and atomic number. The temperature rise integral from high to low is Be > Cu > Au > Mg; c) various elements show different capabilities of heat transfer direction and speed. The mechanism behind these observations was explained in detail. In addition, the temperature rise was investigated briefly on two overlayer structures (Be/Au and Au/Be), showing discontinuous jumping at the interface for two types of materials. This work on the one hand, provides a better understanding and elucidation for physical mechanism of electron-beam-induced deposition, of which process control, performance and reliability would thus get greater improved based on this study, on the other hand, reveals a potential implication that some damages caused by the heat transfer under electron irradiation in a SEM operation might be effectively avoided or reduced through selecting appropriate materials according to their different heat transfer performances.

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection efficiency of the detector and its large array of pixels allow sensitive and accurate detection of Kikuchi bands arising from primary electron beam excitation energies of 4 keV to 28 keV, with the optimal contrast occurring in the range of 8–16 keV. The diffraction pattern acquisition speed is substantially improved via a sparse sampling mode, resulting from the acquisition of a reduced number of pixels on the detector. Standard inpainting algorithms are implemented to effectively estimate the information in the skipped regions in the acquired diffraction pattern. For EBSD mapping, an acquisition speed as high as 5988 scan points per second is demonstrated, with a tolerable fraction of indexed points and accuracy. The collective capabilities spanning from high angular resolution EBSD patterns to high speed pattern acquisition are achieved on the same detector, facilitating simultaneous detection modalities that enable a multitude of advanced EBSD applications, including lattice strain mapping, structural refinement, low-dose characterization, 3D-EBSD and dynamic in situ EBSD.