Nelumbo nucifera Gaertn. (lotus) roots were collected from contaminated sediments which were artificially adding different concentrations of chiral polychlorinated biphenyls (PCBs) to investigate the effect of concentration on the accumulation characteristics and chiral signatures of PCBs in lotus root during its growth period of 150 days. Under high PCB exposure concentration, the biota-sediment accumulation factors (BSAFs) of PCBs 91, 95, and 136 in the lotus root were up to 0.25-0.46 and 8.10-10.5 times higher than those under low-exposure concentration (0.024-0.052). The BSAFs of PCBs 149, 176, and 183 under high-exposure concentration were up to 0.24-0.44, while they were undetected at low concentration. The significant difference observed in the BSAFs based on different concentrations indicates that the lotus root accumulation efficiency toward chiral PCBs increases with the contaminate concentration. Although the (-)-enantiomers of PCBs 91, 95, and 136 wereall preferentially accumulated in lotus root under two exposure concentrations, the extent of the preferential accumulation of (-)-PCB 95 decreased with increasing exposure concentration throughout the whole growth period (30-150 days). In addition, the (-)-enantiomers of PCBs 91 and 136 also showed the same tendency during most of the growth period. Conclusively, the exposure concentrations are an important influence factor on the enantioselective accumulation of chiral PCBs in lotus root.
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