PMN Thin Films Research Articles

Texturing and electrical characteristics of sol-gel derived ferroelectric thin films

Abstract Highly oriented PZT, PLZT and PMN thin films were fabricated on various substrates using sol-gel method. The thin films having different orientation were fabricated by different drying conditions for pyrolysis. The preferred orientations of the PZT, PLZT and PMN thin films were observed using XRD(X-ray diffraction). The hysteresis loops, capacitance-voltage, and fatigue characteristics of the films were investigated using an RT66A standardized ferroelectric test system. The dielectric constant and current-voltage characteristics of the films were investigated using impedance analyzer and pA meter, respectively. The films oriented in particular direction showed better electrical characteristics to the randomly oriented films.

A study of laser-deposited PZT, PLZT, PMN and YBCO thin films

The preparation of epitaxial thin films of Pb(ZrxTi1-x)O3(0.75, 0.25), Pb(ZrxTi1-x)O3(0.52, 0.48) Pb1-xLax(ZryTiz)1-(x4)/O3(0.09, 0.65, 0.35), PbMg13/Nb23/O3 by means of pulsed laser ablation on YBa2Cu3O7-x coated (100)SrTiO3 and (110)SrTiO3 substrates is reported. The films have been characterized by X-ray diffraction, Rutherford backscattering, scanning electron microscopy and electrical measurements. High-quality ferroelectric films were obtained at substrate temperature of 550, 520 and 550 degrees C for Pb(ZrxTi1-x)O3, Pb1-xLax(ZryTiz)1-(x4)/O3 and PbMg13/Nb23/O3, respectively. X-ray diffraction studies of the Pb(ZrxTi1-x)O3/YBa2Cu3O7-x/(100)SrTiO3 show that the layers grow in the c axis orientation with a rocking angle of 0.4 degrees -0.6 degrees for the YBa2Cu3O7-x and 0.8 degrees -1 degrees for the Pb(ZrxTi1-x)O3 layers. The remanent polarization and coercive field of the Pb(ZrxTi1-x)O3(0.52, 0.48) film were 42 mu C cm-2 and 55 kV cm-1.