[001]c-poled Mn-doped xPb(In1/2Nb1/2)O3–(1–x–y)Pb(Mg1/3Nb2/3)O3–yPbTiO3 (PIN–PMN–PT:Mn) single crystals (SCs) in the rhombohedral phase possess not only excellent piezoelectric properties but also a high mechanical quality factor, which make them suitable for fabricating high-performance piezoelectric devices. Characterizing the temperature dependence (TD) of full-matrix constants is indispensable for their use in device design. However, there is a significant lack of relevant data. In this study, the TD of the clamped dielectric properties of [001]c-poled 28PIN-43PMN-29PT:Mn SCs was characterized using a dielectric temperature spectroscopy measurement system from 0 to 60 °C. Their elastic and piezoelectric constants were measured using resonant ultrasound spectroscopy in the same temperature range. With an increase in the temperature, all the elastic stiffness constants decreased, whereas all the clamped dielectric constants and the absolute values of all the piezoelectric stress constants increased. The characterization process required only a single sample, which ensured the consistency of the results. Furthermore, the electrical impedance spectra of the sample at 30 and 50 °C were measured and compared with those simulated using the finite-element method with the characterization results. The close agreement between them confirmed the reliability of the characterization results.
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