This paper presents a refined ultrasonic total focusing method (TFM) for accurately characterizing key defect parameters including size, orientation, and location in complex materials. The proposed approach aims to accurately reconstruct the defect shape in images compromised by grain interference. First, a TFM image database was generated with varying defect parameters and grain noise levels by adopting a custom forward modeling process based on superposition of defect and grain scattering data. Second, a new architecture called TFM-DDPM was then proposed which incorporates TFM and the conditional denoising diffusion probabilistic model (DDPM). Third, pixel-level uncertainty can be quantified through repeated sampling of noise which follows a standard normal distribution. An acceptance criterion for the reconstruction was further established by analyzing the quantified uncertainty. In simulation, the median Dice coefficient between the de-noised TFMs of 30° cracks and their corresponding ground truth images increased from 0.5585 to 0.9137 using the proposed approach, and the median IoU metric rose from 0.3875 to 0.8408. By applying the 6-dB drop approach to the reconstructed images, the root mean squared errors (RMSEs) of size, angle and location were decreased by 93.59%, 86.90% and 86.25%, respectively. It is also demonstrated that our method can reject 69.19% of incorrect characterization results caused by high levels of noise and/or images with steeply inclined (e.g., 45°) cracks, while accepting 97.29% accurate results. Experimental results obtained on nickel-based alloy K403 specimens also exhibited significant improvements. For 2–3 mm cracks, the average sizing error reduced from 0.46 mm to 0.13 mm, and the error in crack angle decreased from 28.63° to 1.50°. Comparable performance enhancements were observed for 4–5 mm cracks using the proposed approach.
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