Over the past decade the achievable resolution of the scanning electron microscope (SEM) in secondary electron (SE) imaging mode has improved by about one order of magnitude. In fact, instruments capable of demonstrating a resolution of one nanometer and exhibiting a probe size of less than 0.6nm are now available. Continued improvements in electron-optics, electron sources, and in electronic and mechanical stability promise even smaller probe sizes that still contain adequate current for imaging. It is therefore relevant to consider what resolution might ultimately be achievable with an SEM in SE mode.The contrast detail in an SE image depends on two factors, the generation of secondaries, and their subsequent escape from the specimen. Changes in either, or both, of these factors will change the number of secondaries collected, and the spatial scale over which this change is accomplished will set the effective resolution of the image (assuming that the physical probe size is small enough to be neglected).