Physical Line Widths Research Articles

Laser-based series interconnection of chalcopyrite und perovskite solar cells: Analysis of material modifications and implications for achieving small dead area widths

Both nanosecond pulses and picosecond laser pulses are used for P2 patterning of chalcopyrite (Cu(In,Ga)Se 2 , CIGSe) and metal halide perovskite solar cell absorber layers. For CIGSe, the range of the modified material visualized by photoluminescence imaging is significantly wider than the actual physical linewidth, since energy input by the laser pulses leads to material modification in the vicinity of the scribed lines. This effect does not occur with the perovskite absorber layers, where there is no apparent influence on the edge regions. From numerical calculations of the temperature depth-profiles and the surface temperature distributions it is concluded that this effect is due to the significantly lower perovskite absorber layer thickness compared to CIGSe and the nevertheless significantly higher laser fluence required for perovskite ablation. The unaffected edge regions around the P2 line in the perovskite enabled a reduction of the dead area width in the fabrication of 3-segmented mini-modules, which could be significantly reduced from 430 to 230 µm, while increasing the aperture area power conversion efficiency and also the geometric fill factor, which could be increased up to 94.6%.

Erratum: “An Extensive Collection of Stellar Wind X‐Ray Source Region Emission Line Parameters, Temperatures, Velocities, and Their Radial Distributions as Obtained fromChandraObservations of 17 OB Stars” (ApJ, 668, 456 [2007

Erratum: “An Extensive Collection of Stellar Wind X‐Ray Source Region Emission Line Parameters, Temperatures, Velocities, and Their Radial Distributions as Obtained from<i>Chandra</i>Observations of 17 OB Stars” (ApJ, 668, 456 [2007

Qualities related to spectra acquisition in inductively coupled plasma-atomic emission spectrometry

Abstract As many elements emit line-rich spectra in ICP-AES, the role of the resolution of the dispersive system has been considered as crucial not only to minimize spectral interferences but also to improve signal-to-background ratios. Resolution is mainly based on the line width measured at half of the peak intensity. Because of the availability of modern gratings, the practical resolution is no longer limited by the diffraction patterns produced by the grating, but is mainly bandpass and optical aberration limited. High resolutions of 5 pm may be obtained in the UV, which has to be compared with the physical line widths in the range 1–6 pm. However, such a high resolution cannot be achieved in the visible region because it is no longer possible to use a high line number for conventional gratings and high diffraction orders for echelle gratings. Moreover, the resolution concept does not consider the line wings, which are of concern for background correction. It is then suggested a measurement of the line profile at 1% of the peak intensity and a comparison with that measured at 50%. Because of the current possibility to have acquisition of the entire, or at least large portions of the UV-visible spectra, wavelength reproducibility may become the most important parameter to facilitate data processing such as spectra addition and subtraction, filtering, deconvolution and line correlation.

H13CO+and CH3OH Line Observations of Prestellar Dense Cores in the TMC‐1C Region

We have mapped the entire TMC-1C region in the H13CO+ (J = 1-0) and CH3OH (JK = 20-10A+) lines at a grid spacing of 50'' with the 45 m telescope at Nobeyama Radio Observatory. We have also conducted high spatial resolution mapping observations of the TMC-1C region at a grid spacing of 34'' in both lines toward a 6' × 6' portion in the south and a 4' × 4' portion in the north. We found that the structure of TMC-1C is filamentary in both molecular lines. The size and position angle of the filament are 0.75 pc × 0.17 pc and 135°, respectively. The filament consists of dense (~105 cm-3) cores which are traced by either H13CO+ or CH3OH lines. We found that the distribution of cores seen in H13CO+ is quite different from the distribution of cores seen in CH3OH. The large velocity gradient analyses indicate that this difference is a result of the relative abundance variation between H13CO+ and CH3OH in the cores by about 1 order of magnitude. We have also carried out multitransitional observations of C3H2 (JK',K'' = 21,2-10,1 and 31,2-30,3) at two positions in the same cloud in order to estimate the molecular hydrogen densities for H13CO+ and CH3OH cores and found that the densities are around 105 cm-3 for both cores. These starless cores (no IRAS source), considered to be prestellar cores, seem to be at chemically different evolutionary stages; the H13CO+ cores are more evolved and closer to protostar formation than CH3OH cores. On the other hand, we found no difference in physical properties, i.e., the size, line width, and mass, between H13CO+ and CH3OH cores; the averages are about 0.07 pc, 0.3 km s-1, and 2 M☉, respectively.

Present and future roles of high performance charge transfer device detectors in spectrochemical analysis

The inductively coupled plasma is widely used as a radiation source in analytical emission spectrometry. Because of the richness of the spectra and the line broadening, the role of the resolving power of the dispersive system is very important. Monochromators allow a flexibility in line selection and can be optimized to obtain the best experimental resolution. Considering the range of the physical line widths of analytes observed in the plasma, specifications can be given for the instrumental broadening of the monochromator. Parameters influencing the instrumental broadening will be described with an emphasis on the resultant spectral slit width. Consequences on the optimization of the signal to background ratio will be discussed.

Some recent studies of inductively coupled plasmas involving the measurement or use of physical line widths: a tutorial discussion with retrospects and extensions

Abstract This paper summarizes a series of studies dealing with the measurement and use of physical line widths, and with related topics such as spectral resolution, spectral interferences, spectrum simulation, and detection limits, with particular reference to inductively coupled plasma atomic emission spectrometry and with emphasis on recent work in Philips Research Laboratories. The article tutorially reviews the essentials of those studies from a uniform and consistent point of view and incorporates additional data not covered in earlier papers. In connection with spectrum simulation and spectral interferences the author points out two crucial questions in a future perspective: (a) the potentials of electronic publications in spectroscopy as a most efficient way for disseminating the results of research, and (b) the promising application of chemometric methods to a “definitive” solution of the spectral interference problem in emission spectroscopy, as evidenced by recent literature, and the need for an effective cooperation between spectroscopists working along this line in order to make the collected data as much as possible universally usable.

Needs for fundamental atomic reference data and data distribution: applied analytical spectroscopy - Response to a questionnaire

Results of a survey of the needs for fundamental data of analytical spectroscopists are pointed out with special reference to applied analytical spectroscopy. Wavelengths, energy levels, level assignments, physical line widths, line shifts, and hyperfine structure are covered. Ways for dissemating fundamental data tabulations to the analytical community are also discussed.

Line selection in atomic emission spectrometry using physically resolved spectra

Abstract Defining a quantitative criterion for line selection as a starting-point this paper discusses the type of data needed (a) in principle and (b) concretely. In this light, the shortcomings of available tabulations are pointed out. It is argued that an adequate approach to fulfil the concrete needs is to compile and store the data as peak wavelengths, peak sensitivities, and physical line widths, along with some mathematical functions that describe the essential line shapes. An approach to achieve this using high-resolution dispersive spectrometry is reviewed and discussed.

Measurement of the practical resolving power of monochromators in inductively coupled plasma atomic emission spectrometry

A method of measuring the practical resolving power of monochromators in inductively coupled plasma atomic emission spectrometry is described. Instead of using a narrow line radiation source, this method makes use of a specific Cd line emitted by the plasma (Cd I 228.802 nm), for which the physical line width is known (0.0014 nm). A quadratic function is used for the convolution of the physical line width and the instrumental broadening. Results are presented for a large selection of readily available monochromators.

A century of spectral interferences in atomic emission spectroscopy — Can we master them with modern apparatus and approaches?

This paper discusses two main aspects of spectral interferences: (1) the handling of the vast amounts of data needed for adequately coping with the lack of selectivity of atomic emission spectroscopy (AES), and (2) the concept of selectivity and the use of selectivity as a major analytical performance characteristic in AES. The main discussion centres about the problem of correctly determining the magnitude of interfering signals in the spectral windows of analysis lines, thus background correction in the widest sense. The approaches are classified into two groups depending on whether the sample concomitants or the gaseous atmosphere in the source contribute unstructured or structured background. The latter situation is emphasized in the subsequent discussion. In this light, the paper reviews data compilations published since in 1884 Hartley laid the foundations of quantitative AES. These compilations are featured as (1) “hardware only” (plates, charts, chart recordings, plots, tables, atlases), (2) “software/hardware conversion” (tape or disk with computer retrieval for data visualization) or (3) “software” only (tape or disk with computer retrieval and processing in combination with data on samples). It is concluded that up to the present most approaches must be categorized as (1) or (2), which means that either the operator looks up and the operator decides or the computer looks up and the operator decides. Only in a few instances are the capabilities of the computer fully exploited and is it the computer which looks up the data and also makes the decisions (“artificial intelligence”). The future should and will see the balance tip into that direction. The second part of the discussion deals with the concept of selectivity and in that context considers the effects of the practical resolving power (“spectral resolution”) on analytical performance in the case of line overlap. A review of early and recent work covers such topics as physical line widths, required spectral resolution, trade-off between spectral resolution and background radiant flux at the detector, and the extent to which modern spectrometers fulfil the conditions for exploiting the benefits of high resolution in ICP-AES. These benefits are discussed in terms of limits of detection, selectivity, and limits of determination. It is shown that, in the case of line overlap, the conventional determination of limits of detection yields irrealistic values, which, in addition, entirely veil the actual benefits of high resolution spectroscopy. The vital profits are related with the selectivity and can be quantitatively expressed in terms of the limit of determination, as defined in this paper. It is concluded that, in the case of line overlap, analytical performance gains much more from an increase in selectivity than from a reduction of conventional detection limits. The full recognition of the implication of this conclusion may still substantially stimulate the further improvement of the analytical performance of AES by the exploitation of high resolution spectroscopy, the optimization of the gaseous atmosphere and the operating conditions of the source, and selective volatilization, where appropriate.

The widths and shapes of about 350 prominent lines of 65 elements emitted by an inductively coupled plasma

Abstract This work describes the measurement of the widths and shapes of about 350 prominent lines of 65 elements emitted by an inductively coupled plasma (ICP). The experimental procedure is an improved version of an earlier described approach using a 1.5-m echelle monochromator with predisperser. For most measurements the practical spectral bandwidth was smaller than 1.5 times the physical line width. Results are reported for both simple lines with chiefly Doppler broadening and complex structures with unresolved or partly resolved hyperfine structure (HFS). An atlas with the spectral scans of about 90 interesting line profiles is included and wavelengths of HFS components are tabulated. The latter were accurately determined in the case of well resolved structures and roughly estimated for poorly resolved or unresolved structures. The data were collected chiefly with a view to spectrochemical analysis, with a threefold aim: (a) to provide the basic data needed for comparing detection limits obtained with spectroscopic apparatus of different bandwidths; (b) to identify HFS components which, under high resolution conditions, may be useful as separate prominent lines in order to circumvent spectral interference and (c) to establish a basis for models that can be used in software for line selection such that the number of data needed in view of differences among line shapes and widths can be reduced to a minimum. It appears from the results that these targets are closely approached. Further work is required, however, for the full implementation of the results.

Physical line widths of atoms and ions in an inductively coupled argon plasma and hollow cathode lamps as measured by an echelle mono-chromator with wavelength modulation

Abstract The spectral line profiles for emission lines of atoms and ions which were produced and excited in an inductively coupled argon plasma at atmospheric pressure have been measured by using an echelle monochromator. The emission line profiles of hollow cathode lamps were also measured to evaluate the resolving power of the monochromator and to deduce the instrument functions at various wavelengths. The line profiles were observed by a wavelength modulation technique; a quartz plate set just behind the entrance slit was modulated at 125 Hz and the photomultiplier output was acquired at 50 points with 2500 times integration for 20 s. The observed line profiles were simulated by the curve-fitting algorithm for the Voigt function, and a -parameters were deduced, after the instrument functions were corrected from the data obtained with the hollow cathode lamp measurements. The physical line widths, a -parameters, and Doppler temperatures obtained are in good agreement with those reported previously.

High-resolution spectroscopy using an echelle spectrometer with predisperser—I. Characteristics of the instrument and approach for measuring physical line widths in an inductively coupled plasma

Abstract This work is the first part of a series of three articles published in the same issue of this journal. This part describes (a) the characteristics of a novel type of echelle monochromator with predisperser in parallel slit arrangement and (b) the application of this instrument to the measurement of physical line widths in an inductively coupled plasma (ICP). The characterization of the instrument includes an outline of the principle and a brief description of the electronic and mechanical control, the detection, readout and software, and the wavelength calibration using 6 neodymium lines emitted from the ICP. This brief characterization is followed by a detailed treatment of the optical properties of the instrument: dispersion, theoretical resolving power, spectral slit, spectral instrumental function and spectral bandwidth. The experimental part deals with the determination of the practical instrumental bandwidth and the coverage of an instrumental broadening effect attributed to aberrations. This contribution from aberrations is determined with the aid of spectral lines emitted from a hollow cathode lamp and is accounted for by a correction of the theoretical spectral bandwidth. The corrected instrumental function is subsequently used to derive physical line widths from measured effective line widths. The results agree well with those recently published by other authors using different methods. It is concluded that the present approach yields values of physical line widths sufficiently accurate to make an extension of the measurements to a larger number of spectral lines interesting. The article is concluded with a discussion of the extent to which the practical resolving power of the instrument matches the physical characteristics (line widths) of ICP spectra, that is, whether the instrument is capable of the complete physical resolution of the spectra under analytically usable conditions. This discussion borrows an essential result from Part II as to the minimum slit widths compatible with the available radiant flux reaching the detector, which, in view of the associated shot noise, limits the resolving power that can be actually exploited under practical analytical conditions. It is argued that a practical resolving power of 50 000–70 000 in the low u.v. and of 60 000–100 000 in the visible can be realistically used in line-rich spectra (with an inherently enhanced background [Parts II and III], while practical resolving powers of up to about twice these values would be ideally required. It is further shown that the mechanical resolution links up well with the analytically usable practical spectral bandwidth.

Influence of the dispersive system in inductively coupled plasma atomic emission spectrometry

Abstract A 3600- lines mm holographic grating in a 1-m monochromator has been used in both the first and second orders in order to determine the experimental resolving power required in ICP-AES to approach the physical line width. A value of 150000 is proposed. The influence of several parameters including line number, order and optical aberrations, has been studied. Consequences of high resolution for line separation, signal-to-background and signal-to-noise ratios, and calibration curve linearity for resonance broadened lines and lines with hyperfine structure are illustrated.

ChemInform Abstract: CARBON‐13 LINE WIDTH CRITERION FOR THE LEL CONFORMATION OF CHELATED DIAMINE LIGANDS

Chemischer InformationsdienstVolume 14, Issue 52 Physical Organic Chemistry ChemInform Abstract: CARBON-13 LINE WIDTH CRITERION FOR THE LEL CONFORMATION OF CHELATED DIAMINE LIGANDS R. G. KIDD, R. G. KIDDSearch for more papers by this author R. G. KIDD, R. G. KIDDSearch for more papers by this author First published: December 27, 1983 https://doi.org/10.1002/chin.198352045Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume14, Issue52December 27, 1983 RelatedInformation

ChemInform Abstract: RAMAN LINE WIDTH STUDY OF ROTATIONAL MOTION OF CYCLOHEXANE IN AQUEOUS SOLUTION

Chemischer InformationsdienstVolume 13, Issue 19 Physical Organic Chemistry ChemInform Abstract: RAMAN LINE WIDTH STUDY OF ROTATIONAL MOTION OF CYCLOHEXANE IN AQUEOUS SOLUTION K. TANABE, K. TANABESearch for more papers by this author K. TANABE, K. TANABESearch for more papers by this author First published: May 11, 1982 https://doi.org/10.1002/chin.198219067AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article. Volume13, Issue19May 11, 1982 RelatedInformation

ChemInform Abstract: DEPHASING TIMES AND LINEWIDTHS OF OPTICAL TRANSITIONS IN MOLECULAR CRYSTALS: TEMPERATURE DEPENDENCE OF LINE SHAPES, LINEWIDTHS, AND FREQUENCIES OF RAMAN ACTIVE PHONONS IN NAPHTHALENE

Chemischer InformationsdienstVolume 10, Issue 28 Physical Organic Chemistry ChemInform Abstract: DEPHASING TIMES AND LINEWIDTHS OF OPTICAL TRANSITIONS IN MOLECULAR CRYSTALS: TEMPERATURE DEPENDENCE OF LINE SHAPES, LINEWIDTHS, AND FREQUENCIES OF RAMAN ACTIVE PHONONS IN NAPHTHALENE J. C. BELLOWS, J. C. BELLOWSSearch for more papers by this authorP. N. PRASAD, P. N. PRASADSearch for more papers by this author J. C. BELLOWS, J. C. BELLOWSSearch for more papers by this authorP. N. PRASAD, P. N. PRASADSearch for more papers by this author First published: July 10, 1979 https://doi.org/10.1002/chin.197928049AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article. Volume10, Issue28July 10, 1979 RelatedInformation

ChemInform Abstract: ESR LINE WIDTH AND EXCHANGE NARROWING IN POWDER SAMPLES

Chemischer InformationsdienstVolume 4, Issue 52 Physical Organic Chemistry ChemInform Abstract: ESR LINE WIDTH AND EXCHANGE NARROWING IN POWDER SAMPLES B. N. MISRA, B. N. MISRASearch for more papers by this authorS. K. GUPTA, S. K. GUPTASearch for more papers by this author B. N. MISRA, B. N. MISRASearch for more papers by this authorS. K. GUPTA, S. K. GUPTASearch for more papers by this author First published: December 25, 1973 https://doi.org/10.1002/chin.197352092Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume4, Issue52December 25, 1973 RelatedInformation

Crystalline structure of nickel powders

A precise relationship between the line width obtained by direct measurement (B), the standard line width (b), and the true physical line width (fl) is given by the method of harmonic analysis of the interference line profile. Among the disadvantages of this method are the laborious calculations involved and the sensitivity of the method to errors linked with the determination of the line background. In the majority of cases, the method of harmonic analysis may be replaced by the method of approximation with an accuracy which is entirely adequate for practical purposes. A study of the annealing processes of various nickel powders demonstrated that the broadening of the lines of the specimens investigated was not much greater than the broadening due to photography geometry In view of this, in the determination of the true physical broadening (fl), it is not permissible to ignore the line broadening caused by radiation nonuniformity. The intensity distribution of a standard nickel specimen may be approximated by a Gaussian curve. A graph for calculating the correction for radiation nonunifortuity was given in [2]. To obtain the true physical broadening (fl) for nickel powders from the integral line width of a specimen (B) and the line width of a standard (b), the following expression was utilized: This equation applies to an intermediate case between those when the observed and instrumental profiles are described by a Gaussian or a Cauchy curve. Figure 1 presents a curve of fl/B plotted against b/B, from which the true physical broadening can be determined. Knowing the values of/9 of two lines, it is possible to evaluate the part played by the factor of block size and second-type microstresses. Figure 2 shows a nomogram of the ml/fl 1 vs fl2/fll and n2/f12 vs B2/B1 relationships, where m 1 is the fraction of the broadening due to lattice distortions. The nomogram was constructed for nickel powders, for lines (111) and (222) obtained in Cu K ~ radiation. To plot these curves, use was made of the fact that the broadening due to block size for lines (111) corresponds to the broadening due to crystalline lattice distortions for lines (222) and together, for each of them, is equal to the true physical broadening ~, as calculated from Eq. (1). The block size and the magnitude of crystalline lattice distortions were calculated from the wellknown formulas: D = 0,94~ Aa ~ ~icos~l ' a = 4r,~n~"