Thin-film lithium niobate electro-optic modulators (TFLN EOMs) are widely utilized across various fields due to their exceptional performance. In this theoretical study, we optimized a TFLN EOM featuring a multimode interference coupler, cosine-curved waveguides, and a modulating arm straight waveguide structure. By tuning the etching depth, waveguide width, and geometric parameters of the traveling wave electrodes, we achieved a half-wave voltage-length product of 1.6V⋅cm and a 3 dB bandwidth of approximately 140 GHz. Additionally, we performed a multiphysics analysis to investigate the temperature characteristics of the modulator. The results indicate that increased temperature induces thermal-optic effects in the material, leading to changes in the waveguide’s refractive index and the optical beam phase, which results in increased insertion loss. Moreover, the stress generated by thermal expansion is concentrated in the modulator’s waveguide, representing a weak point that is prone to failure.
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