AbstractA modification of energy dispersive X‐ray fluorescence (ED‐XRF) for analysis of trace element concentrations in suspended particulate matter (SPM) in seawater and intercomparison with high‐resolution inductively coupled plasma‐mass spectrometry (HR ICP‐MS) is presented. Approximately 250 SPM samples were collected on polycarbonate track‐etched filters in the Indian Ocean during the U.S. CLIVAR/CO2 Repeat Hydrography meridional section I09N cruise in 2007. Samples were first analyzed by ED‐XRF, a nondestructive technique, for Al, P, Ti, Mn, Fe, Ni, Cu, and Zn and subsequently digested and quantified by HR ICP‐MS, creating two blind, basin‐scale data sets used for a paired statistical comparison. Our results found (1) ED‐XRF analysis using thin‐film principles can quantify the elemental composition of SPM at nanomolar concentrations found in the open ocean; (2) there was excellent agreement between ED‐XRF and HR ICP‐MS analyses for Al, Fe, and Mn and good agreement for P and Ti; (3) analytical differences were the largest for Cu, Ni, and Zn; (4) HR ICP‐MS methods have lower detection limits for most elements when compared to the ED‐XRF; (5) ED‐XRF analysis has a closer agreement to reported values for the NIST SRM 2783 standard and lower relative standard deviations when compared to the HR ICP‐MS. We recommend continued refinement of nondestructive ED‐XRF methods as this would allow for the easy exchange of filtered samples between lab groups for intercalibration and intercomparison of basin‐scale hydrographic cruises and archival for future analysis.