A model for the resistance-induced potential distribution at thin layer electrodes during linear sweep voltammetric experiments is considered and results of calculations based on this model are presented. It is shown that cell geometry is an extremely important factor in determining the extent to which linear sweep voltammograms are affected by solution resistivity. Cell geometries providing for a radially uniform current path are superior to those where a parallel current path exists. Other important factors include electrode area and placement of the Luggin capillary.
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