To achieve high-performance organic light-emitting diodes (OLEDs), various amorphous organic semiconductor materials were developed, and the higher-order structure of their films and their formation dynamics were investigated. In particular, their molecular orientations were widely analyzed because it significantly affects optical and electrical properties of the OLEDs. However, conventional methods of the analysis of the orientation order parameter ( S ) need the construction of an anisotropic optical model, which brings a certain degree of analytical error and thus makes it difficult to assess the slight changes in S values arising from differences in experimental conditions. In this study, we present a simple model-free analytical method to estimate S values, named "QACIOS", that avoids the significant analytical errors and applies to various OLED materials, including materials that easily crystallize. In applying the method to UV/visible and IR spectral regions, the S values of electronic and vibrational transition dipole moments in the films can be simply estimated. The orientations of functional groups in single-layer and multilayer samples are obtainable separately, and in situ measurements are also demonstrated. Furthermore, we present a systematic analysis of the dependence of S on experimental conditions during sample fabrication such as deposition rate, substrate temperature, and substrate surface. From this analysis, the difference in formation dynamics of the molecular orientation of two structural isomers of OLED materials is quantitatively clarified, further demonstrating the usefulness of the method. A model-free simple analytical method by quantitative absorbance comparison with an isotropically oriented standard (QACIOS) is applied to systematic investigation of orientations of long molecular axis and functional groups in amorphous organic semiconductor films and their formation dynamics. • A model-free simple analytical method for reliable estimation of orientation order parameter is proposed and applied to many kinds of amorphous OLED materials. • Orientation analysis of functional groups in single-layer and multilayer samples are performed. • The difference in formation dynamics of molecular orientation of two OLED isomers is clarified quantitatively. • The method can be a commonly-used standard method for orientation analysis of OLED films.
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