X-ray standing waves excited in inorganic and organic multilayered structures were respectively used as structural probes for (1) determination of interlayer distribution of entrapped argon atoms in a tungsten-silicon multilayer (48 layer pairs) prepared by sputter deposition techniques and for (2) the study of a heterostructure in a Langmuir-Blodgett film (two monolayers of barium arachidate and two monolayers of manganese stearate on top of 59 monolayers of lead stearate). In the first expeirment, the density of argon atoms in the silicon layers ( ≈ 18 Å) was found to be 2–4 times higher than that in the tungsten layers ( ≈ 12 Å). In the second experiment, the difference between barium-manganese and manganese-lead interlayer distances was successfully detected .