Ordinary Optical System Research Articles

Application of Vacuum Photoelectric Detection Technology in Super-Resolution System

Due to the wave characteristics of light, diffraction occurs when the light passes through the optical system, so that the resolution of the ordinary far-field optical system is limited by the size of the Airy disk diameter. There are various factors that cause image quality degradation during system detection and imaging, such as optical system aberrations, atmospheric inter-ference, defocusing, system noise and so on. Super-resolution optical imaging technology is the most innovative breakthrough in the optical imaging and detection field in this century. It goes beyond the resolution limit of ordinary optical systems or detectors, and can get more details and information of the structure, providing unprecedented tools for various fields. Compared with ordinary optical systems, super-resolution systems have very high requirements on the signals to be detected, which cannot be met by ordinary detection techniques. Vacuum photoelectric detection and imaging technology is equipped with the characteristics of high sensitivity and fast response. It is widely used in super-resolution systems and has played a great role in super-resolution systems. In this paper, the principles and structure of the image-converter streak camera super-resolution system, scanning electron microscopy super-resolution system and laser scanning confocal super-resolution system will be sorted out separately, and the essential role of the vacuum photoelectric detection technology in the ultra-microscopic sys-tem will be analyzed.

Magnon-induced transparency and amplification in 𝒫𝒯-symmetric cavity-magnon system.

Recent research on parity-time- (𝒫𝒯-) symmetric optical structures have exhibited great potential for achieving distinctive optical behaviour which is unattainable with ordinary optical systems. Here we propose a 𝒫𝒯-symmetric cavity-magnon system consisting of active cavity mode strongly interacting with magnon to study magnon-induced transparency (MIT) and amplification (MIA) by exploiting recent microwave-cavity-engineered ferromagnetic magnons. We find that (i) due to the gain-induced enhancement of coherent coupling between the cavity field and the magnon, the transmitted probe power is remarkably enhanced about four orders of magnitude and the bandwidth also becomes much narrower, compared to passive cavity system. (ii) More importantly, the light transmission can be well controlled by adjusting the applied magnetic field without changing other parameters, and a Lorentzian-like spectra can be established between the transmitted probe power and the external magnetic field, which provides an additional degree of freedom to realize the coherent manipulation of optical transparency and amplification. Our results may offer an approach to make a low-power magnetic-field-controlled optical amplifier in 𝒫𝒯-symmetric cavity-magnon system.

Statistics of speckle focused through a hard-edged pupil

We examine the statistical properties of speckle patterns in and near the far-field, produced by an ordinary optical system having a hard-edged pupil. By applying Fresnel diffraction theory, expressions for the contrast in terms of the statistical parameters of rough surfaces and the geometry of the optical system are derived and discussed. It is shown that the contrast of speckle has maxima and minima in the focal plane and also along the axis of the optical system.

Diffusion and Depth of Field in an Ordinary Optical System

Diffusion and Depth of Field in an Ordinary Optical System

Diffusion and Depth of Field in an Ordinary Optical System

Diffusion and Depth of Field in an Ordinary Optical System

Diffraction Anomaly of Various Types of Extended Source –By Polarizing Microscope with Crossed Nicols–

Diffraction images by polarizing microscope with the crossed Nicols were extensively studied by Kubota and Saito. Their work is mainly on the diffraction image of a point source through this system. In this paper, the study is furthered to diffraction images of various types of extended coherent, incoherent or partially coherent secondary sources (object apertures) such as slit, circular, rectangular and triangular types. These images are of unusual patterns different from the Airy-type ones formed by an ordinary optical system, and the patterns are strongly dependent upon the illumination conditions of the source. Diffraction patterns are theoretically calculated on an electronic computer and shown in contour lines of intensity. Photographs taken with a ruby optical maser are shown for comparison. The relationships between the diffraction images and the size of the various extended sources or the illumination conditions are discussed.

IMAGE FORMATION BY ELECTRONS

The formation of images by electrons, much as optical images are formed by light, has given rise to a new branch of science called “electron optics,” which forms the basis for many interesting and important uses of electrons, including modern television and the electron microscope. As the determination of the paths of light rays constitutes an important part of the design of an ordinary optical system, the determination and control of electron trajectories is the function of electron optics.