Fast signal processing at the speed of light is the main advantage of photonic integrated circuits. Therefore, these circuits have good prospects for the implementation of mathematical calculations, including matrix to vector multiplication. The purpose of the research was to create and investigate a technique for automatic measurement of brightness distribution along optical waveguides of analogue photonic integrated circuits. Empirical methods (observation, measurement, comparison, experiment) and a complex method (analysis and synthesis) have been used during the research. The proposed technique uses a digital camera that captures images of optical waveguide illuminated by light emitting diodes and image processing software to calculate brightness distribution. This technique determines the best approximation of this distribution, calculates parameters of brightness non-uniformity and losses of optical radiation. Measurements of a set of optical waveguides help to identify the best candidates for photonic integrated circuits. It has been found that optical waveguides with grinded surfaces acting as diffusive scattering have good combination of smooth brightness distribution and small losses of optical radiation. Due to multiple diffuse reflection and scattering within waveguide material, these waveguides are promising candidates for analogue photonic integrated circuits. All other waveguides with non-processed surface, with grooves or grinded with a large grain have sufficient losses of optical radiation. These losses are usually caused by the exit of optical radiation from waveguide surface. The obtained results are necessary for accurate design of circuits that takes into account scattering and losses in optical waveguides. The proposed technique can be applied in automatic technological process of manufacturing a fast and economical photonic matrix to vector multiplication, which does not require expensive electron-beam, optical or laser lithographic equipment