Weibull analysis and weakest link theory are employed to resolve the probability of crystalline silicon PV cell fracture when measured as bare cells and when stressed in reduced- and full-sized modules. Experimental results indicated that the characteristic cell strength is reduced by ~20% once packaged into the laminate of a one-cell module and loaded in four-point flexure (4PF). This experimental observation was shown consistent with a weakest link theory prediction that the strength limiting flaws reside on the surface of the cell's edge. The analysis is ultimately extended to present the equivalent loading of four-cell modules by uniform pressure and 4PF and a uniformly loaded full-sized module and demonstrates that smaller, representative, modules must be loaded to a much higher level than their parent full-sized modules to achieve an equivalent probability for cell fracture.