Structural and electrical properties of the system crystallizing in K2NiF4 structure, La2-xSrxNiO4(O≤x≤1.6) were studied. Powder x-ray diffraction data were analyzed by the Rietveld method to determine the bond lengths. Tetragonality in the lattice parameters, c/a, shows a maximum at x=0.6, while, distortion of a NiO6 octahedron, Ni-0(2)(//c-axis)/ Ni-O(1)(//a-axis), monotonously decreases from 1.17(x=0) to 1.03(x=1.4). A metal-semiconductor transition in observed for O<x<l.2, the transition temperature decreasing from 690K(x=0) to 20K(x=1.2). For x≥1.3, the specimen show metallic behavior down to 10K.