No-clean Solder Paste Research Articles

Influence of Solder Mask on Electrochemical Migration on Printed Circuit Boards.

Electrochemical migration (ECM) on the surface of printed circuit boards (PCBs) continues to pose a significant reliability risk in electronics. Nevertheless, the existing literature lacks studies that address the solder mask and solder pad design aspects in the context of ECM. Therefore, the objective of this study was to assess the impact of solder mask type with varying roughness and solder pad design on the susceptibility to ECM using a water drop test and thermal humidity bias test. Hot air solder leveling-coated PCBs were tested. Furthermore, the ECM tests were conducted on PCBs with applied no-clean solder paste to evaluate the influence of flux residues on the resulting ECM behavior. The results indicated that the higher roughness of the solder mask significantly contributes to ECM inhibition through the creation of a mechanical barrier for the dendrites. Furthermore, lower ECM susceptibility was also observed for copper-defined pads, where a similar effect is presumed. However, the influence of the no-clean flux residues can prevail over the effects of the solder mask. Therefore, the use of a rough solder mask and a copper-defined pad design is recommended if the PCB is to be washed from flux residues after the soldering process.

Freeze Frame Reflow to Enhance Yields for Advanced Low-Profile Bottom Terminated Packages

Today, designers are demanding an overall form-factor reduction to save board space, increase functionality, and allocate more circuit board real estate toward end-user applications – all with less space allocated to power management where not just the X-Y shrink but the 3D volumetric shrink is required. Unlike most gull wing style leaded packages, QFNs (Quad Flat Pack No lead packages) also known as BTCs (Bottom Terminated Components) have coplanar terminals below the package body to answer this ever-decreasing form-factor requirement. The final standoff in these QFN style packages are dictated by the solder joint geometry formed. Within this advanced package family also finding a similar trend are power WCSPs (Wafer Chip Scale Packages) where traditional solder spheres are being replaced with low profile interconnects in expanded and asymmetrical geometries. This paper presents factors that influence advanced low standoff package solderability performance with the use of video microscopy and live in situ X-ray reflow. To reflect the QFN board assemblies that are typically designed a series of layouts were implemented across different coupon test boards. Assembled coupon test board were designed by varying 1) through hole via design, 2) solder mask tenting techniques, 3) periphery and center thermal pad printed solder joint volumes, 4) no-clean and water-soluble solder paste flux chemistry all using SAC 305 alloy and type 4.5 powder size. One case study using live in-situ X-ray system will explain the effects of a QFN land pattern layout incorporating vias in the center thermal pad with solder mask tenting over the via openings located on the back of the PCB. In another configuration vias were removed from the center thermal pad and vacuum reflow performed during the liquidus phase of the solder with an explanation of why some of the voids remained. The first and second order results presented within this paper have practical implications and from their observations a novel process evaluation technique coined as Freeze Frame Reflow (FFR) was developed. In the last case study presented, an advanced mrQFN (multi-row QFN) package is investigated for factors affecting yields. FFR is then implemented resulting in an increase in yield further demonstrating the benefits this new & novel technique can offer.

Advanced No-Clean Solder Paste for SIP applications

Abstract This paper reports the comparison of two solder pastes made using a no clean flux platform and ultrafine SAC305 powders of Type 7 and Type8+, made using Heraeus’ Welco® technology. The application tests were carried out using 008004 components, the smallest passives used in SiPs. For the paste with Type 7 powder, the application tests complete with 12hrs of stencil evaluation have been reported, whereas for the paste with Type8+ powder, a preliminary work-life evaluation has been reported. Both pastes have been compared for the release performance using area ratios down to 0.35, with both circular and square stencil opening apertures. Cleaning evaluation was carried out with some of the commercially available cleaning agents to assess the compatibility of the flux residue. It has been demonstrated that the no clean solder paste with Type 7 powder has excellent stencil work-life performance until 12hrs of printing, with voids after reflow being less than 10%. The paste with Type8+ shows better release performance vis-à-vis Type 7, down to area ratio of 0.35, for square stencil opening aperture. Results from cleaning evaluation show the leftover contamination can be fully removed.

Fluxes Effective in Suppressing Non-Wet-Open at BGA Assembly

Abstract With the advancement in miniaturization, the die is getting thinner and the solder bump is getting smaller for BGAs. Consequently, the thermal warpage is getting more severe due to coefficient of thermal expansion mismatch between die and molding compound, and often resulted in non-wet-open (NWO) at BGA assembly. NWO has been ailing the industry for a long time, and costly rework is required to remove the problem. In this study, a “cold-welding barrier” method has been developed in suppressing NWO. At BGA assembly, after printing solder paste onto PCB, the BGA bumps are dipped into creamy flux prior to placing onto paste printed. This flux pickup will effectively suppress NWO by serving as cold-welding barrier. A low activity flux is considered having as wider reflow profile window than a medium activity flux. Alternatively, the solder bump of BGA can be pre-coated with solid flux at packaging house. The effect of solid-flux coating is equally effective in suppressing NWO. As cold welding barrier, both no-clean flux and water soluble flux are considered physically effective. However, a water soluble flux should not be used together with a no-clean solder paste based on compatibility and reliability consideration. Furthermore, only no-clean solid flux is recommended for solder bump coating purpose, mainly based on moisture pickup issue associated with water soluble flux.

High Reliability No-Clean Solder Paste for Designs where Flux Cannot be Dried

The miniaturization trend is driving industry to adopting low standoff components or components in cavity. The cost reduction pressure is pushing telecommunication industry to combine assembly of components and electromagnetic shield in one single reflow process. As a result, the flux outgassing/drying is getting very difficult for devices due to poor venting channel. This resulted in insufficiently dried/burnt-off flux residue. For a properly formulated flux, the remaining flux activity posed no issue in a dried flux residue for no-clean process. However, when venting channel is blocked, not only solvents remain, but also activators could not be burnt off. The presence of solvents allows mobility of active ingredients and the associated corrosion, thus poses a major threat to the reliability. In this work, a new halogen-free no-clean SnAgCu solder paste, 33-76-1, has been developed. This solder paste exhibited SIR value above the IPC spec 100 MΩ without any dendrite formation, even with a wet flux residue on the comb pattern. The wet flux residue was caused by covering the comb pattern with 10 mm × 10 mm glass slide during reflow and SIR testing in order to mimic the poorly vented low standoff components. Paste 33-76-1 also showed very good SMT assembly performance, including voiding of QFN and HIP resistance. The wetting ability of paste 33-76-1 was very good under nitrogen. For air reflow, 33-76-1 still matched paste C which is widely accepted by industry for air reflow process. The above good performance on both non-corrosion with wet flux residue and robust SMT process can only be accomplished through a breakthrough in flux technology.

에폭시 경화형 무세정 SAC305 솔더 페이스트의 리플로우 공정성과 보드레벨 BGA 솔더 접합부 특성

첨단 전자기기에 사용되는 전자부품의 크기와 접속피치가 감소하면서 리플로우 공정 후 플럭스 잔사의 세정이 어려워짐에 따라 무세정 솔더 페이스트에 대한 요구가 증가하고 있다. 본 연구에서는 SAC305 솔더분말과 에폭시 레진을 주성분으로 하는 경화성 플럭스를 혼합하여 제조한 에폭시 경화형 솔더 페이스트에 대하여 리플로우 공정성, 플럭스 잔사의 부식성, 솔더볼 및 보드레벨 BGA 패키지 솔더 접합부의 기계적 거동을 기존 로진계 솔더 페이스트와 비교하여 평가하였다. 에폭시 경화형 솔더 페이스트는 솔더 접합부 주변에 경화물 필렛을 형성한 것으로 보아 플럭싱 작용에 의해 솔더 접합부가 형성된 이후에 경화반응이 진행되는 것을 확인할 수 있었으며, 동판에 대한 젖음성 시험을 통해 기존상용 솔더 페이스트 정도의 납퍼짐성을 갖는 것을 알 수 있었다. 리플로우 후 동판에 대한 고온 고습 시험을 통해 에폭시 경화형 솔더 페이스트는 동판 부식을 전혀 발생시키지 않는 것으로 나타났는데, 이는 FT-IR 분석결과 에폭시 경화반응을 통해 단단히 고정된 결과로 생각되었다. 볼전단, 볼당김 및 다이전단 시험 결과, 솔더 접합부 주변에 형성된 경화물 필렛은 솔더 표면과 접착본딩을 형성하며, 다이전단강도를 15~40% 정도 향상시키는 것으로 보아 에폭시 경화형 솔더 페이스트는 플럭스 잔사 세정공정의 생략과 함께 솔더 접합부 보강효과를 통해 패키지 신뢰성 향상에도 기여할 수 있을 것으로 생각되었다. With difficulties during the cleaning of reflow flux residues due to the decrease of the part size and interconnection pitch in the advanced electronic devices, the need for the no-clean solder paste is increasing. In this study, an epoxy curable solder paste was made with SAC305 solder powder and the curable flux of which the main ingredient is epoxy resin and its reflow solderability, flux residue corrosivity and solder joint mechanical properties was investigated with comparison to the commercial rosin type solder paste. The fillet shape of the cured product around the reflowed solder joint revealed that the curing reaction occurred following the fluxing reaction and solder joint formation. The copper plate solderability test result also revealed that the wettability of the epoxy curable solder paste was comparable to those of the commercial rosin type solder pastes. In the highly accelerated temperature and humidity test, the cured product residue of the curable solder paste showed no corrosion of copper plate. From FT-IR analysis, it was considered to be resulted from the formation of tight bond through epoxy curing reaction. Ball shear, ball pull and die shear tests revealed that the adhesive bonding was formed with the solder surface and the increase of die shear strength of about 15~40% was achieved. It was considered that the epoxy curable solder paste could contribute to the improvement of the package reliability as well as the removal of the flux residue cleaning process.

A Novel Epoxy Flux On Solder Paste For Assembling Thermally Warped POP

A novel epoxy flux EF-A was developed with good compatibility with no-clean solder pastes, and imparts high reliability for BGA assembly at a low cost. This compatibility with solder pastes is achieved by a well-engineered miscibility between epoxy and no-clean solder paste flux systems, and is further assured with the introduction of a venting channel. The compatibility enables a single bonding step for BGAs or CSPs, which exhibit high thermal warpage, to form a high-reliability assembly. Requirements in drop test, thermal cycling test (TCT), and SIR are all met by this epoxy flux, EF-A. The high viscosity stability at ambient temperature is another critical element in building a robust and user-friendly epoxy flux system. EF-A can be deposited with dipping, dispensing, and jetting. Its 75°C Tg facilitates good reworkability and minimizes the adverse impact of unfilled underfill material on TCT of BGA assemblies.

Understanding the Influence of Copper Nanoparticles on Thermal Characteristics and Microstructural Development of a Tin-Silver Solder

This paper presents and discusses issues relevant to solidification of a chosen lead-free solder, the eutectic Sn-3.5%Ag, and its composite counterparts. Direct temperature recordings for the no-clean solder paste during the simulated reflow process revealed a significant amount of undercooling to occur prior to the initiation of solidification of the eutectic Sn-3.5%Ag solder, which is 6.5 °C, and for the composite counterparts, it is dependent on the percentage of copper nanopowder. Temperature recordings revealed the same temperature level of 221 °C for both melting (from solid to liquid) and final solidification (after recalescence) of the Sn-3.5%Ag solder. Addition of copper nanoparticles was observed to have no appreciable influence on melting temperature of the composite solder. However, it does influence solidification of the composite solder. The addition of 0.5 wt.% copper nanoparticles lowered the solidification temperature to 219.5 °C, while addition of 1.0 wt.% copper nanoparticles lowered the solidification temperature to 217.5 °C, which is close to the melting point of the ternary eutectic Sn-Ag-Cu solder alloy, Sn-3.7Ag-0.9Cu. This indicates the copper nanoparticles are completely dissolved in the eutectic Sn-3.5%Ag solder and precipitate as the Cu6Sn5, which reinforces the eutectic solder. Optical microscopy observations revealed the addition of 1.0 wt.% of copper nanoparticles to the Sn-3.5%Ag solder results in the formation and presence of the intermetallic compound Cu6Sn5. These particles are polygonal in morphology and dispersed randomly through the solder matrix. Addition of microsized copper particles cannot completely dissolve in the eutectic solder and projects a sunflower morphology with the solid copper particle surrounded by the Cu6Sn5 intermetallic compound coupled with residual porosity present in the solder sample. Microhardness measurements revealed the addition of copper nanopowder to the eutectic Sn-3.5%Ag solder resulted in higher hardness.

Heraeus introduces top performing no-clean solder paste

Heraeus introduces top performing no-clean solder paste

AIM develops lead-free pin probe testable no-clean solder paste

AIM develops lead-free pin probe testable no-clean solder paste

Heraeus introduces top performing F10 no-clean solder paste

Heraeus introduces top performing F10 no-clean solder paste

Non-refrigerated no-clean solder paste

Non-refrigerated no-clean solder paste

Multicore solders introduces new lead-free no-clean solder paste for SMT assembly

Multicore solders introduces new lead-free no-clean solder paste for SMT assembly

The effect of solder paste residues on RF signal integrity

Wireless devices such as pagers and cellular phones are becoming common consumer items. These products require low loss RF signal propagation which is affected by material choices and processing conditions. This paper examines the effect of a series of no-clean solder pastes on signal integrity using an RF test circuit which sends a broadband signal through a gallium arsenide antenna switch and measures its transmission using a network analyzer. The test circuit also measures signal leakage. This paper reports on two different test vehicles, one that uses a 900 MHz antenna switch, and the other that uses a 2.0 GHz antenna switch. The transmission and leakage readings were taken daily for 16–21 days while the test vehicles were under accelerated aging conditions of 85°C and 85% RH. Average values for the readings for each solder paste were plotted to provide comparison among the pastes. The comparison data clearly distinguish solder pastes that provide consistency throughout the test period from those which do not.

Heraeus introduces lead- and halide-free no-clean solder paste

Heraeus introduces lead- and halide-free no-clean solder paste

No-clean solder paste development for printed-circuit board Naoki Itoh, Mutumi Yoshino, Osamu Takenaka (Denso Co., Ltd.), Eiichi Sudoh (Toyota Central R & D Labs., Inc.), Masami Aihara (Harima Chemicals, IMS.)

No-clean solder paste development for printed-circuit board Naoki Itoh, Mutumi Yoshino, Osamu Takenaka (Denso Co., Ltd.), Eiichi Sudoh (Toyota Central R & D Labs., Inc.), Masami Aihara (Harima Chemicals, IMS.)

Undercooling of 63SN-37PB Solder Pastes

Large-scale undercoolings and long incubation periods for solidification of 63Sn-37Pb solder pastes were observed through a differential scanning calorimeter, as functions of cooling rate and contact surface (aluminium versus copper). The undercooling reduced significantly with decreased cooling rate, but even at a rate of 2°C/minute, the undercooling was as large as 35°C for a no-clean solder paste in an aluminium sample pan. Poor wetting conditions (weak flux, nonwetting surfaces) led to large undercoolings and long incubation periods. The undercooling during a typical reflow process in electronic assembly was determined, by a simulated DSC test, to be about 50°C for a no-clean solder paste on bare copper surface. The large undercooling is probably caused by the reduced degree of the heterogeneous nucleation for solidification due to the small size of a solder joint and poor wetting with its contact surface.

Effect of post-reflow no-clean solder paste residue on electrical performance

An experiment was conducted to examine the effect of postreflow no-clean solder paste residue of near-end and far-end signal crosstalk due to changes in dielectric constant and leakage resistance in the circuit environment. Additionally, the effect of different frequency levels on postreflow residue was examined. The results suggest that postreflow residues affect the signal-to-noise ratio on circuit boards, depending on the chemistry, residue level, and dielectric properties of these pastes. Higher levels of residues may cause signal degradation on the transmission lines. The noise level on circuit boards increases significantly if a solder paste exhibits excessive residue. Increased crosstalk is believed to be caused by an increase in the dielectric constant (excessive postreflow residues) between two transmission lines. The effect of postreflow residue on circuit performances was more noticeable at frequencies greater than 1 MHz. >