It is well established that some metals, such as palladium and nickel, can easily penetrate into tungsten by fast diffusion via crystal defects such as grain boundaries and dislocations. As a result of the fast penetration of these so called activators the recrystallization temperature of heavily drawn non-sag tungsten wire can be lower from about 2,000 C to about 1,000 C, thus the application of the tungsten wire, serving as reinforcement material in metal matrix composites used at high temperatures, is limited. An interesting question is in which form these activators exist in the recrystallized tungsten wire. It is generally believed that W-Ni intermediate compounds could form in the recrystallized material, presumably at grain boundaries. The free energy difference between the pure tungsten fibbers and the precipitating W(Ni) solid solution was suggested as the chemical driving force which governed the recrystallization process. The presence of nickel in small particles had also been observed in recrystallized grains of nickel plated tungsten wires using scanning electron microscopy (SEM) and secondary ion mass spectroscopy. These particles were considered to be nickel rich precipitates. However, a detailed investigation of the precipitation process has not been reported. In the present work an investigation of themore » structure, composition and distribution of nickel rich particles precipitated in recrystallized grains of nickel plated heavily drawn non-sage tungsten wires was carried out using analytical electron microscopy (AEM).« less
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