X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscope (AFM), Fourier transform infrared (FTIR) spectra and differential scanning calorimetry (DSC) were used to investigate the structure of K x V 2O 5. nH 2O xerogel films (with 0.0 ≤ x < 0.0091 mol). These films were produced by the sol–gel technique. XRD as well as TEM showed that K x V 2O 5. nH 2O thin films are highly oriented nanocrystals. The particle size as obtained is on the average 12 nm. AFM revealed that the grain shape of the present samples is a rod-like shape. DSC showed an endothermic peak with a minimum ranging between 102 °C and 172 °C due to the intercalation of K + ions.
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