International Journal of Computational Engineering ScienceVol. 04, No. 03, pp. 695-698 (2003) Poster PapersNo AccessFABRICATION OF ULTRAHIGH-DENSITY NANO-PYRAMID ARRAYS (NPAs) ON (100) SILICON WAFER USING SCANNING PROBE LITHOGRAPHY AND ANISOTROPIC WET ETCHINGJENG T. SHEU, CHENG C. CHEN, SUN P. YEH, and HSEIH T. CHOUJENG T. SHEUDepartment of Electrical Engineering, National Chi Nan University, No. 1, University Rd., Puli, Nantou 545, Taiwan, R.O.C. Search for more papers by this author , CHENG C. CHENDepartment of Electrical Engineering, National Chi Nan University, No. 1, University Rd., Puli, Nantou 545, Taiwan, R.O.C. Search for more papers by this author , SUN P. YEHDepartment of Electrical Engineering, National Chi Nan University, No. 1, University Rd., Puli, Nantou 545, Taiwan, R.O.C. Search for more papers by this author , and HSEIH T. CHOUDepartment of Electronic Engineering, National Yunlin University of Science and Technology, 123, University Rd., Section 3, Touliu , Yunlin 640, Taiwan, R.O.C. Search for more papers by this author https://doi.org/10.1142/S1465876303002076Cited by:0 PreviousNext AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail AbstractConvex and concave nano-pyramid Arrays (NPAs) with an areal bit density of 258 Gbits/in2 has been demonstrated by means of scanning probe lithography (SPL) and wet ecthing on the (100) silicon wafer. We investigated the use of a contact-mode atomic force microscope (AFM) in the generation of oxide patterns on silicon (100) surfaces. Subsequently, utilizing oxide patterns as Si etching masks, the Si substrate was dipped in aqueous KOH solution, where un-oxidized regions are selectively etched by aqueous KOH orientation-dependent etching (ODE). Using this simple process, 20nm convex NPAs with 100nm pitch can be fabricated successfully. Similarly, about 2nm concave NPAs with 100nm were obtained after the oxidized samples were dipped in acqueous HF solution, the oxide regions were selectively etched away. To demonstarte the capability of this technology, the ascii codes were written on silicon and the data storage density more than 10 times of current optical recording has been achieved. We also demonstrated that the minimum size of the pyramids and the minimum pitch could be easily controlled by the apex size of the pyramid, that is, the size of the oxidized region by AFM-based field-induced oxidation. The results indicated that this technique has potentials to provide a pathway to the higher densities that will be needed in the decades ahead.Keywords:Nano-pyramid Arraysscanning probe lithographyatomic force microscopeorientation-dependent etching References J. Itoh, Appl. Surf. Sci. 111, 194 (1997). Crossref, Google ScholarS. Y. Chouet al., J. Vac. Sci&Technolo. B 15, 2897 (1997). Crossref, Google ScholarM. Kohet al., Jpn. J. Appl. Phys. 39, 2168 (2000). Google ScholarJ. A. Dagataet al., Appl. Phys. Lett. 56, 2001 (1990). Crossref, Google ScholarE. S. Snow and P. M. Campbell, Appl. Phys. Lett. 64, 1932 (1994). Crossref, Google ScholarJ. A. Dagataet al., J. Appl. Phys. 84, 6891 (1998). Crossref, Google Scholar K. E. Bean , IEEE Trans. Electron Devices ED-25 1185 . Google ScholarS. M. Sze, Semiconductor Device: Physics and Technology (Wiley, New York, 1981) p. 66. Google ScholarPh. Avouriset al., Appl. Phys. A 66, 659 (1998). Crossref, Google Scholar FiguresReferencesRelatedDetails Recommended Vol. 04, No. 03 Metrics History KeywordsNano-pyramid Arraysscanning probe lithographyatomic force microscopeorientation-dependent etchingPDF download
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