During the last two decades, several simulation tools have been proposed for the modeling of electronic equipments in function of the physical environmental changes. It was stated that numerous electronic components such as semiconductor devices can be afiected by the mechanistic efiects, humidity or simply the temperature variations. To study the last efiect, based on the multilayer perceptron neural network (MLPNN), a characterization method of the passive electronic device thermal efiects is introduced in this paper. The method proposed was realized toward the equivalent circuit identiflcation of the under test device (R, L, C components) measured input impedances. To demonstrate the relevance of the method, numerical computations with MLPNN algorithms implemented into Matlab were performed. First, a capacitor modeling from 30kHz to 1GHz for the temperature variation from 25 - C to 130 - C is presented. It was found that a good agreement between the proposed model and the measurement is observed. Then, a commercial EMI low-pass fllter was also characterized in RF frequencies through the S-parameter identiflcation. Finally, further discussion on the potential applications of this work, in particular, in the electromagnetic compatibility (EMC) fleld is ofiered in the last part of this paper.