Surface structures and thermal stability of the ultrathin In films adsorbed on two different (α(√3 × √3) and β(√3 × √3)) Pb/Si(111) surfaces, varying in initial reconstructions, are investigated in situ with Low Energy Electron Diffraction (LEED) and X−ray Photoemission Spectroscopy (XPS). For the In/Si(111)−α(√3 × √3)−Pb system, In atoms invert their initial positions with the Pb surfactant at 470 K, resulting in formation of disordered mixed (In,Pb) overlayers. Moreover, Pb atoms located on the topmost layer desorb easily until the critical coverage is reached. Unreconstructed mixed (In,Pb) layers are also observed on the In/Si(111)−β(√3 × √3)−Pb system at room temperature due to In adsorption on Si surface in positions located between Pb atoms. Increasing the temperature of the samples yielded an arrangement of the adsorbate and surfactant atoms to 2D compounds with various periodic array. The new surface structures identified as (2 × 2) (4 × 1), and (√3 × √3) have been found to be formed in both systems. The detailed analyses of combining XPS and LEED data reveal that the phases can be built by either pure In or (In,Pb) compounds.
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