Microcontroller Module Research Articles

Design for Testability Technique for Microcontroller

Testing of embedded system including microcontroller is difficult task with external Automatic Test Equipment (ATE). Therefore, empowering the microcontroller to test itself as software-based self-testing (SBST) looks the suitable solution like the microprocessor testing. Practically, the SBST is not suitable for microcontroller testing. It utilizes large space area in the program memory inside the microcontroller that has limited space area in the available memory. Also, it cannot test all microcontroller internal modules and when it test internal modules it cannot make sure that the General Purpose Input Output (GPIO) of the microcontroller work probably without using external ATE. So the Design for Testability (DFT)methodology that uses Instruction Set Architecture (ISA) of the microcontroller family to generate test subroutines and for the Test Pattern Generator (TPG) and part of the Built-In Self-Test (BIST) control unit and uses the external ATE for the other part of the BIST control unit and for the test response compaction (TRC) and evaluation. This paper introduces a hybrid testing methodology that combines both SBST and hardware-based self-test (HBST) for microcontroller testing as an efficient DFT methodology. It introduces for either in the field or as part of a production test of a microcontroller as an example of the system of chip (SoC). This DFT methodology is based on divide and conquer algorithm and requires knowledge of the ISA of the microcontroller to test not only the embedded processor found in microcontroller but also test other peripherals found in it using brute force technique. The comparison between the SBST and the presented hybrid methodology is based on memory utilization, number of clock cycles that was taken to complete each test and the number of modules that can be tested using each of them. Experimental results indicate that the presented methodology is superior in memory utilization, test time and can test all microcontroller modules for both 18F4X2 and 16F87X families.

A Three-Way Remote Intelligent Terminal Based on Common Mobile

An intelligent terminal of telemetering, remote control and remote signaling which was capable of all the system operation regarding distant data transmission and monitoring on mobile, was assembled through the application of microcontroller and industrial communication module. Various physical quantities of devices could be measured and text-message transmitted by the designed multi-sensor. a microcomputer control center monitoring all kinds of terminals could be set up. The design can be further applied in Internet of Things.

A low cost embedded solution for detection and analysis of three-dimensional gestures through wireless communication

This paper describes the concept of a non-optical acceleration-based gesture recognition system for a low cost and small size remote control for mobile robots which is capable of recognizing more than 5 gestures based on the input signals from a MEMS 3-axes accelerometer and a MEMS 2 axes-gyroscope. The system is designed like a wristwatch and based on a microcontroller module which detects the accelerations and the movements of the user's arm and transmits the results wirelessly to a receiver. The two main topics in this paper are the description of the hardware and the newly developed algorithm used to analyze and classify the detected movements in comparison to the traditional algorithms Hidden Markov Model (HMM) and Dynamic Time Warping (DTW).

EPICS IOC module development and implementation for the ISTTOK machine subsystem operation and control

This paper presents a developed, tested and integrated EPICS IOC (I/O controller) module solution for the ISTTOK tokamak machine operation and control for the vacuum and gas injection systems. The work is organized in two software layers which communicate through a serial RS-232 communication protocol. The first software layer is an EPICS IOC module running as a computer server application capable of receiving requests from remote or local clients providing driver interface to the system by forwarding requested commands and receiving system and control operation status. The second software layer is the firmware running in Microchip dsPIC microcontroller modules which performs the interface from RS-232 optical fiber serial protocol to EPICS IOC module. The dsPIC module communicates to the ISTTOK tokamak sensors and actuators via RS-485 and is programmed with a new protocol developed for this purpose that allows EPICS IOC module command sending/receiving, machine operation control and monitoring and system status information. Communication between EPICS IOC module and clients is achieved via a TCP/IP and UDP protocol referred as Channel Access. In addition, the EPICS IOC module provides user client applications access allowing operators to perform remote or local monitoring, operation and control.

Development of a Hard Microcontroller

The applicability of commercially available microprocessors to certain systems requiring radiation survival was assessed. A microcontroller was designed and built to perform a monitor and control function of military operational ground equipment, and demonstrated to exceed the radiation hardness goal. The preparation of the microcontroller module required hardware and software design, selection of LSI and other piece part types, development of piece part and module electrical and radiation test techniques, and the performance of radiation tests on the LSI piece parts and the completed module. The microcontroller has a 16-bit central processor unit, a 4096 word read only memory, and a 256 word read-write memory. The module has circumvention circuitry, including a PIN diode radiation detector. The processor device used was the MMI 6701 T2L Schottky bipolar 4-bit slice. Electrical exerciser circuits were developed for in-situ electrical testing of microprocessors and memories during irradiation. A test program was developed for a Terradyne J283 microcircuit tester for more complete electrical characterization of the MMI 6701 microprocessor. A simple self-test algorithm was used in the microcontroller for performance testing during irradiation. For the operational demonstration of the microcontroller a TI 960A minicomputer was used to provide the required complex inputs to the module and verify the module outputs. Radiation test data was acquired on several LSI device types, including T2L, I2L, and NMOS technologies. Dose rate tests were performed on the module and proper circumvention and recovery obtained up to and including the maximum test level of 108 rad(Si)/sec.