BiFeO3 (BFO), a Pb-free perovskite oxide, is being explored for its potential use in a multitude of applications. We report on the oriented growth of BFO thin films using a facile metal-organic chemical solution deposition. Unlike the growth characteristics observed in Si/SiO2 and glass/FTO substrates, the solution growth process on sapphire (0001) is found to yield highly oriented thin films along (100)pc planes. Furthermore, annealing in air (BFO-A) and high-vacuum (BFO-V) ambients are done to explore the tunable limits of its physical properties. Temperature-dependent Raman studies highlight the high quality of thin films with sharp changes in Raman modes around transition temperatures. In addition, the films exhibit a hitherto unreported anomalous shift in A1(TO) and E(TO) modes around 450 K. The bandgap of BFO-V (Eg = 2 eV) is lower than that of BFO-A (Eg = 2.12 eV) and exhibits an increased defect photoluminescence emission. The magnetization (M) is twofold higher for BFO-V [M ≈ 42 (67) emu/cm3 at 300 K (5 K)]. In-plane and out-of-plane M vs H plots show larger anisotropy and hard hysteresis for BFO-A compared to BFO-V. Piezoelectric switching with d33 values of 5–10 pm/V is the characteristic of BFO ferroelectric materials. Photoconductivity measurements show a one order increase due to vacuum annealing. Carrier generation and recombination lifetimes are twofold faster in BFO-V as compared to BFO-A thin films. The controllable physical properties of oriented BiFeO3 thin films will be useful in magnetoelectrics and photoferroelectrics applications.
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