A twin-transistor random access memory (TTRAM) can provide high speed, low power and high density with CMOS compatible SOI process. However it is difficult to handle as the unified memory required for advanced SoC because it needs the simple control sensing operation for memory compiler, higher cell efficiency, and lower voltage operation for dynamic frequency and voltage control. Enhanced TTRAM (ET <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> RAM) applies the actively body-bias control technique to realize the low voltage array operation, and never require the negative voltage source. The ET2RAM can realize both 263 MHz at 0.8 V and 10.2 mW at 0.5 V random-cycle operation, higher cell efficiency, and process scalability. It also provides the simple control method suitable for the unified macro for system-level power management SoC with keeping the merits of TTRAM as CMOS compatibility