Magnetic force microscopy is finding widespread use in the analysis of magnetic structure at length scales relevant to modern storage densities. We present a new technique which uses the extremely localized stray fields of MFM tips to probe submicron media characteristics. The tip is brought into contact with the magnetized media, and a uniform external field Hext is momentarily added to the tip’s stray field. If the net field exceeds the local media coercivity, the magnetization is reversed locally, and a ‘‘bit’’ is written. High-resolution MFM imaging of the results is done immediately using the same probe. Bit arrays of several Gbit/in2 can be produced with the lithography software of a commercial MFM. Using the external field Hext as a parameter, the threshold for bit writing can be determined, giving a measure of the local, or ‘‘point’’, coercivity of the media on a 100 nm scale. Results for perpendicular Co–Cr and magneto-optical media can deviate significantly from conventional bulk hysteresis measurements, in some cases reversing the bulk coercivity ranking. Intermediate values of Hext reveal spatial variations in the point coercivity due to fluctuations in composition or microstructure. In square media, sufficiently strong fields Hext cause existing bits to grow, leading to bulk reversal via front propagation, and allowing a direct measurement of wall motion coercivity. Possible extensions to longitudinal media will be discussed. In general, combining the imaging and writing capabilities of MFM probes gives a direct assessment of media response to very localized fields, and leads to a powerful method for relating microstructure to bulk hysteresis properties.