The temperature dependence of the critical density of superconducting current jc(τ) [τ=(1−T∕Tc), and Tc is the critical temperature] of two epitaxial c-oriented YBa2Cu3O7−δ thin films grown on LaAlO3 and SrTiO3 substrates has been investigated by the method of dynamic magnetic susceptibility. In both samples, the jc(τ) dependence has two sections with power dependences jc∼τ3∕2 and jc∼τ2 in the temperature region from 77K to Tc, with crossover between them. Measurements were made of the temperature dependences of the dynamic relaxation rate Q(τ) (magnetic flux creep), which turned out to be unconnected with the observed crossovers. It is shown that the observed features of jc(τ) are not caused, as was assumed earlier, by the limitation of the critical depairing current density in the interdislocation gaps of the interblock boundaries of YBa2Cu3O7−δ epitaxial thin films. Based on numerical calculations, it is shown that the existence of crossovers and the breakdown of H∕τ scaling detected in one of the samples (H is the dc magnetic field) in the jc(τ,H) magnetic-field dependences close to Tc can be explained by the manifestation of macroscopic inhomogeneity of the samples in the local values of the critical temperature Tc (Tc inhomogeneity). The absence of observable breakdown of the H∕τ scaling in the second sample is explained by the smaller width of the distribution over Tc in it by comparison with the first sample.
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