Gd-, Y-, and La-doped CeO2 films (Gd0.2Ce0.8O2, Y0.2Ce0.8O2, and La0.2Ce0.8O2) are prepared on Ni–W tapes and La2Zr2O7-buffered Ni–W tapes using sol–gel method. The films are characterized by X-ray diffraction and atomic force microscopy. Results indicate that Y0.2Ce0.8O2 (YCO) film shows the better crystallinity and the surface quality compared with Gd0.2Ce0.8O2 (GCO) and La0.2Ce0.8O2 (LCO) films. The YCO buffer layer has good in-plane texture with purely c-oriented grains. The YCO films deposited on La2Zr2O7 (LZO) also demonstrate the good texture and the perfect surface quality. YBCO films are prepared on the YCO/LZO and LCO/LZO composite buffer layers through the low fluorine solution route. The YBCO film deposited on the YCO/LZO buffer layer displays a high T c of 89.6 K with a low transition temperature width (ΔT = 0.45 K), and a J c value of 0.5 MA/cm2, which is superior to that deposited on LCO/LZO buffer layer. Gd-, Y-, and La-doped CeO2 films (Gd0.2Ce0.8O2, Y0.2Ce0.8O2, and La0.2Ce0.8O2) are prepared on Ni–W tapes through sol–gel method. GCO film has a coarse surface, and the YCO film has the best texture and surface quality. Y0.2Ce0.8O2/La2Zr2O7 and La0.2Ce0.8O2/La2Zr2O7 composite buffer layers are also prepared and compared. The surface quality of Y0.2Ce0.8O2/La2Zr2O7 is superior to that of La0.2Ce0.8O2/La2Zr2O7 composite buffer layer. High-T c YBCO films with sharp ΔT = 0.45 K and a J c value of 0.5 MA/cm2 are successfully obtained on the Y0.2Ce0.8O2/La2Zr2O7 film, which is superior to that on La0.2Ce0.8O2/La2Zr2O7 buffer layer.