An Automated Bidirectional Reflectance Acquisition Measurement System (ABRAMS) has been constructed to facilitate measurement of bidirectional reflectance from soil and vegetative samples in the laboratory. The system illuminates a sample with linearly-polarized laser light, λ = 632.8 nm, and measures the like- and cross-polarized scattered intensities over half a hemisphere. System design and polarized bidirectional reflectance measurements from a soil sample and SiO 2 spherical particles are discussed in this work. It is shown that polarization information in the plane of incidence is useful for identifying certain scattering mechanisms associated with soil reflectance. This is because the like-polarized intensity, I vv, is influenced by single-scattered light and the cross-polarized intensity, I HV, is strongly influenced by multiple-scattered light. For example, comparable levels of I VV and I HV indicated that the reflectance of soils, especially those made up of translucent particles, is dominated by significant multiple scattering because single scattering causes minimal depolarization in the plane of incidence. Furthermore, I HV is less dependent on the illumination angle (hence, more Lambertian) than I VV, indicating that the scattering mechanisms which caused them are not the same.