The performance improvement of solid-state triplet-triplet annihilation-based photon upconversion (TTA-UC) systems is required for the application to various solar devices. The performance can be improved by making use of the local strong electric field generated through the excitation of localized surface plasmon (LSP) resonance of metal nanostructures. However, since the improvement is effective only within the limited nanospace around nanoparticles (i.e., the near-field effect), a methodology for improving the performance over a wider spatial region is desirable. In this study, a significant improvement in the threshold light excitation intensity (Ith) (77% decrease) as the figure of merit and the upconverted emission intensity (6.3 times enhancement) in a solid-state TTA-UC film with a thickness of 3 μm was achieved by stacking the film with periodic Ag half-shell arrays. The highest-enhanced upconverted emission was obtained by tuning the diffuse reflectance peak, which results from the excitation of LSP resonance of the Ag half-shell arrays, to overlap well with the photoexcitation peak of the sensitizer in the TTA-UC film. The intensity of the enhanced upconverted emission was independent of the distance between the lower edge of the TTA-UC film and the surface of half-shell arrays in the nanometer order. These results suggest that the performance improvement was attributed to the photoexcitation enhancement of the sensitizer by elongating the excitation light path length inside the TTA-UC film, which was achieved through a strong backward scattering of the incident light based on the LSP resonance excitation (i.e., the far-field effect). In addition, the upconverted emission was improved using half-shell arrays comprising low-cost Al, although the enhancement factor was 3.5, which was lower than that of Ag half-shell arrays. The lower enhancement may be attributed to a decrease in the backward scattering of the excitation light owing to the intrinsic strong interband transition of Al at long visible wavelengths.