This work demonstrates a method to directly determine edge orientations of three‐fold symmetric two‐dimensional crystals in real space, without resolving the edge structure. In an annular dark‐field scanning transmission electron microscope, the orientation of an edge is derived from the overall edge direction recorded at a low magnification and the crystal orientation revealed by atomic resolution, element‐contrast imaging at a high magnification. By applying this method, the edge orientation of equilateral triangle‐shaped hexagonal boron nitride (h‐BN) crystals grown by chemical vapor deposition on Cu is experimentally determined for the first time. The experimentally determined nitrogen‐terminated zigzag edges validate the kinetic theory of h‐BN crystal growth, which is a useful case study of the growth of 2D crystals lacking inversion symmetry.
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