We report the impact of superlattice periodicity and thicknesses over structural, electrical, and magnetic profiles of ferromagnetic/antiferromagnetic (FM/AFM) superlattices (SLs). Five superlattices [(LCMO)m/(PCMO)n]p (m/n = individual layer thickness (nm), p = number of layers; LP1 (m,n = 6.6 nm, p = 11), LP2 (m = 8.8 nm, n = 4.4 nm, p = 20), LP3 (m,n = 11 nm, p = 25), LP4 (m,n = 22 nm, p = 13), and LP5 (m,n = 33 nm, p = 9) consisting of FM La0.7Ca0.3MnO3 (LCMO) and AFM Pr0.58Ca0.42MnO3 (PCMO) layers alternatively were grown over LaAlO3 substrates by RF magnetron sputtering method. The HRXRD diffraction pattern shows that the SLs with thin individual layers (≤11 nm) (LP1, LP2, LP3) have distinct satellite peaks. However, the diffraction scan of SL having an individual layer thickness of ∼ 22 nm (LP4), displayed two sets of peaks. It is anticipated that the one closer to the substrate peak belongs to the strained layers and the farther one is for the relaxed layers of the SL. The SL with an even higher period thickness of ∼ 33 nm (LP5) is relatively more relaxed and an amalgamation of satellite peaks is observed. The resistivity trend for LP4 is found to be quite similar to LCMO thin film whereas LP5 displayed a broader transition and depreciated insulator–metal transition (IMT). Another observation of our study is that the maximum magnetization attained by LP5 is almost half of the maximum magnetization for the LP4 SL. The structural features appear to follow a correlated trend but the electrical and magnetic properties of these superlattices differ from each other to a considerable extent. This divergence in properties for SLs is attributed to the phenomena associated with the thickness of individual layers and the number of interfaces existing.