keV Photon Energy Research Articles

Ultrafast X-ray laser-induced explosion: How the depth influences the direction of the ion trajectory

Single particle imaging using X-ray lasers is a technique aiming to capture atomic resolution structures of biomolecules in their native state. Knowing the particle's orientation during exposure is crucial for method enhancement. It has been shown that the trajectories of sulfur atoms in a Coulomb exploding lysozyme are reproducible, providing orientation information. This study explores if sulfur atom depth influences explosion trajectory. Employing a hybrid collisional-radiative/molecular dynamics model, we analyze the X-ray laser-induced dynamics of a single sulfur ion at varying depths in water. Our findings indicate that the ion spread-depth relationship depends on pulse parameters. At a photon energy of 2 keV, high-charge states are obtained, resulting in an increase of the spread with depth. However, at 8 keV photon energy, where lower charge states are obtained, the spread is essentially independent with depth. Finally, lower ion mass results in less reproducible trajectories, opening a promising route for determining protein orientation through the introduction of heavy atoms.

Visualizing plasmons and ultrafast kinetic instabilities in laser-driven solids using X-ray scattering

Ultra-intense lasers that ionize atoms and accelerate electrons in solids to near the speed of light can lead to kinetic instabilities that alter the laser absorption and subsequent electron transport, isochoric heating, and ion acceleration. These instabilities can be difficult to characterize, but X-ray scattering at keV photon energies allows for their visualization with femtosecond temporal resolution on the few nanometer mesoscale. Here, we perform such experiment on laser-driven flat silicon membranes that shows the development of structure with a dominant scale of 60 nm in the plane of the laser axis and laser polarization, and 95 nm in the vertical direction with a growth rate faster than 0.1 fs−1. Combining the XFEL experiments with simulations provides a complete picture of the structural evolution of ultra-fast laser-induced plasma density development, indicating the excitation of plasmons and a filamentation instability. Particle-in-cell simulations confirm that these signals are due to an oblique two-stream filamentation instability. These findings provide new insight into ultra-fast instability and heating processes in solids under extreme conditions at the nanometer level with possible implications for laser particle acceleration, inertial confinement fusion, and laboratory astrophysics.

Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL.

Xray free-electron lasers (XFELs) enable experiments that would have been impractical or impossible at conventional X-ray laser facilities. Indeed, more XFEL facilities are being built and planned, with their aim to deliver larger pulse energies and higher peak brilliance. While seeking to increase the pulse power, it is quintessential to consider the maximum pulse fluence that a grazing-incidence FEL mirror can withstand. To address this issue, several studies were conducted on grazing-incidence damage by soft X-ray FEL pulses at the European XFEL facility. Boron carbide (B4C) coatings on polished silicon substrate were investigated using 1 keV photon energy, similar to the X-ray mirrors currently installed at the soft X-ray beamlines (SASE3). The purpose of this study is to compare the damage threshold of B4C and Si to determine the advantages, tolerance and limits of using B4C coatings.

On the thermal stability of multilayer optics for use with high X-ray intensities

High-intensity X-ray free electron laser (XFEL) beams require optics made of materials with minimal radiation absorption, high diffraction efficiency, and high radiation hardness. Multilayer Laue lenses (MLLs) are diffraction-based X-ray optics that can focus XFEL beams, as already demonstrated with tungsten carbide/silicon carbide (WC/SiC)-based MLLs. However, high atomic number materials such as tungsten strongly absorb X-rays, resulting in high heat loads. Numerical simulations predict much lower heat loads in MLLs consisting of low atomic number Z materials, although such MLLs have narrower rocking curve widths. In this paper, we first screen various multilayer candidates and then focus on Mo2C/SiC multilayer due to its high diffraction efficiency. According to numerical simulations, the maximum temperature in this multilayer should remain below 300°C if the MLL made out of this multilayer is exposed to an XFEL beam of 17.5 keV photon energy, 1 mJ energy per pulse and 10 kHz pulse repetition rate. To understand the thermal stability of the Mo2C/SiC multilayer, we performed a study on the multilayers of three different periods (1.5, 5, and 12 nm) and different Mo2C to SiC ratios. We monitored their periods, crystallinity, and stress as a function of annealing temperature for two different heating rates. The results presented in this paper indicate that Mo2C/SiC-based MLLs are viable for focusing XFEL beams without being damaged under these conditions.

High-brightness betatron emission from the interaction of a sub picosecond laser pulse with pre-ionized low-density polymer foam for ICF research

Direct laser acceleration (DLA) of electrons in plasmas of near-critical density (NCD) is a very advancing platform for high-energy PW-class lasers of moderate relativistic intensity supporting Inertial Confinement Fusion research. Experiments conducted at the PHELIX sub-PW Nd:glass laser demonstrated application-promising characteristics of DLA-based radiation and particle sources, such as ultra-high number, high directionality and high conversion efficiency. In this context, the bright synchrotron-like (betatron) radiation of DLA electrons, which arises from the interaction of a sub-ps PHELIX laser pulse with an intensity of 1019 W/cm2 with pre-ionized low-density polymer foam, was studied. The experimental results show that the betatron radiation produced by DLA electrons in NCD plasma is well directed with a half-angle of 100–200 mrad, yielding (3.4 ± 0.4)·1010 photons/keV/sr at 10 keV photon energy. The experimental photon fluence and the brilliance agree well with the particle-in-cell simulations. These results pave the way for innovative applications of the DLA regime using low-density pre-ionized foams in high energy density research.

Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source.

High-resolution imaging of Cu/low-k on-chip interconnect stacks in advanced microelectronic products is demonstrated using full-field transmission X-ray microscopy (TXM). The comparison of two lens-based laboratory X-ray microscopes that are operated at two different photon energies, 8.0 keV and 9.2 keV, shows a contrast enhancement for imaging of copper nanostructures embedded in insulating organosilicate glass of a factor of 5 if 9.2 keV photons are used. Photons with this energy (Ga-Kα radiation) are generated from a Ga-containing target of a laboratory X-ray source applying the liquid-metal-jet technology. The 5 times higher contrast compared to the use of Cu-Kα radiation (8.0 keV photon energy) from a rotating anode X-ray source is caused by the fact that the energy of the Ga-Kα emission line is slightly higher than that of the Cu-K absorption edge (9.0 keV photon energy). The use of Ga-Kα radiation is of particular advantage for imaging of copper interconnects with dimensions from several 100 nm down to several 10 nm in a Cu/SiO2 or Cu/low-k backend-of-line stack. Physical failure analysis and reliability engineering in the semiconductor industry will benefit from high-contrast X-ray images of sub-μm copper structures in microchips.

Study of population dynamics toward the development of atomic X-ray lasers in the 3–5 keV photon energies

X-ray free-electron lasers (XFELs) are powerful tools for characterizing and probing the properties of matter at atomic resolution on the ultrafast timescale. However, they have certain limitations such as spectral fluctuation and poor temporal coherence. Atomic X-ray lasers offer the narrow bandwidth, longitudinal coherence, and spectral stability that can overcome these limitations. In this paper, we study the interaction of inner-shell vacancy states with high-intensity XFEL pulses. We show that it is possible to achieve population inversion between K-shell and L-shell vacancy states in calcium and titanium when pumped by high-intensity XFEL pulses. These states can be used to generate atomic X-ray laser emission in the 3–5 keV photon energy range.

Design strategies and technology of Elettra 2.0 for a versatile offer to the user community

Elettra 2.0 will be a fourth generation storage ring light source replacing the existing Elettra synchrotron. This article illustrates design strategies, physical investigations and technical choices to meet multiple and sometimes conflicting requirements. These include to make Elettra 2.0 a fully transversely coherent source up to 0.5 keV-photon energy, diversify the type of experiments through a very broad range of photon energies, from infrared to hard x-rays, maximize the number of photon beamlines in excess of 2-times the machine periodicity, and be able to produce picosecond-long light pulses at MHz repetition rate without interference to the standard multi-bunch operation. Most recent advancements in beam physics, technical systems and installation plan are reported with some detail.

Study of phantom materials close to 1 keV photon energy for radiation applications

Low-energy photons can be dangerous for human organs, tissues or significant molecules like DNA, RNA. Significant phantom materials, which can be used in diagnostic radiology, radiation protection, radiation dosimetry, and dose estimations, were investigated in terms of some essential radiation application quantities. Mass attenuation coefficient, mean free path, half value layer, tenth value layer, effective atomic number, gamma constant and dose rates were studied below 1 keV due to no data about the phantom materials yet. These parameters were compared with water to study the water equivalence property. Modelling clay has been found to be the best equivalent phantom material for water on behalf of effective atomic number (mean ratio: 0.97) and MFP, HVL, TVL (mean ratio: 1.71) respectively. In the light of the obtained results, it was concluded that this study can be very useful for various imaging and therapeutic procedures in medical physics.

Nuclear shielding characteristics of newly developed composite metal foams: Role of CeO2 addition and foam type

In present study, new composite materials which were produced by filling open-cell aluminum foams of different thickness and pore size with various additives were surveyed with respect to photon and fast neutron shielding effectiveness. The metal foam samples were prepared in two different series (A: 30 mm thick with a pore size of 2 pores/cm and B: 10 mm thick with a pore size of 16 pores/cm) according to thickness and pore sizes, and the foams were filled with different mixtures which include Epoxy(60)-B2O3(20)-CaO(20-x)-CeO2(x); (x; 0, 5, 10, 15 and 20 wt%) chemical compositions. Gamma, X-ray and neutron measurements of the produced samples were performed using Ultra-Ge detector, linear accelerator (LINAC) and BF3 neutron detector, respectively. The gamma-transmission measurements were achieved for 30.9, 59.54, 75, 81, 276, 303, 356, 384, and 662 keV photon energies using radioactive sources of 241Am, 137Cs, 133Ba. Linear Attenuation Coefficients (LAC) of the samples were figured out with the data acquired from the measurements and MAC, HVL, Zeff and Ne values were found by way of these values. The MAC, Zeff and Ne values of the samples increased with the rising in the percentage of CeO2 added to the mixture. The energy absorption (EABF) buildup factors of the composite metal foam samples were also determined for the energy range of 0.015–15 MeV at 1–40 mfp penetration depths. It was found that the A5 and B5 samples with 20% CeO2 additive had the least EABF values. Lastly, the shielding capability of the fabricated samples against fast neutrons was specified by executing equivalent dose measurements (EAD) and calculated macroscopic cross section (∑R) values. It was established that the A2 sample had the highest absorption dose rate of 49%. The largest of the theoretically calculated ∑R values belongs to the B5 sample with 20% CeO2 additive. Generally, it was concluded that the samples in the B series, which are thinner and have more pores, have better radiation attenuation capabilities.

Detecting and shielding properties of Ce3+-doped zinc–gadolinium-fluoroborate glasses for X-ray and proton radiation

Zinc-gadolinium-fluoroborate glasses doped with cerium fluoride (CeF3) were successfully fabricated to detect and shield X-ray and proton radiation. The doped glasses were studied at varying ZnO concentrations to investigate their properties, including density, transmittance, photoluminescence, and the oxidation states of dopants The glasses were tested for their sensitivity to detect X-ray and proton radiation, and calculations of the half-value layer and proton range were used to investigate their shielding properties. The results showed that an increase in ZnO concentrations induced a higher glass density and shifted the absorption edge to a longer wavelength (redshift) in the optical transmittance spectra. The cerium dopant mainly formed the Ce3+ oxidation state, resulting in a single broad band emission due to the 5d→4f transition of Ce3+ ions. The luminescence behavior of the doped glasses under x-ray irradiation showed a single broad emission at 375 nm. In contrast, under proton irradiation, the single broad emission shifted to a longer wavelength at 400 nm. The increase in ZnO concentration decreased light emission when exposed to x-rays and protons. The results also demonstrated that increasing ZnO concentrations improved the shielding properties of the glasses. We found that the glass with a 25 mol% ZnO concentration revealed a half-value layer of the 100 keV photon energy equal to 0.116 ± 0.001 cm, and a 70 MeV proton energy penetrated the maximum range in the glass at 1.308 ± 0.019 cm. We concluded that ZnO could be used to control the fraction between Ce3+ and Ce4+ ions in the cerium ions of the CeF3-doped glasses.

Dose-efficient scanning Compton X-ray microscopy

The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement scheme for hard X rays, and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample, as confirmed by imaging a silicon wedge. Based on these results, we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument.

The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultra-intense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. The precise determination of the focal spot size and shape on a sub-micrometer level is essential for a number of high energy density studies requiring either a pin-size backlighting spot or extreme intensities for X-ray heating.

Study of Ni/AlN/Ni waveguide system for 8.05 keV incident energy

Ni/AlN/Ni waveguide system provides intensity enhancement by a factor of ~30 at 8.05 keV photon energy. In the present study, the effect of deviation of structural parameters (thickness of each layer) along with the surface-interface properties on electric field intensity (EFI) inside an ion beam sputter deposited Ni/AlN/Ni waveguide is investigated. EFI calculations are performed using structural parameters obtained from X-ray reflectivity (XRR) measurements performed using Cu-Kα source. Deposited waveguide structure provides intensity enhancement (~26) slightly lower than optimized value (~30). Furthermore, temporal stability of the structure is investigated using combined XRR and grazing incidence X-ray fluorescence (GIXRF) techniques (at 15 keV photon energy) after about 15 months. Some structural changes are observed which, however, do not lead to further decrease in intensity enhancement inside the waveguide, making it suitable for applications at 8.05 keV photon energy.

Analysis of the error budget for a superconducting undulator SASE line at European XFEL

European XFEL is investing in the development of superconducting undulators (SCUs) for future upgrade of its beamlines. SCUs made of NbTi, working at 2 K, with a period length of 15 mm and a vacuum gap of 5 mm allow covering a range between 54 keV and 100 keV. The effect of mechanical errors in the distribution of the undulator parameter K along the undulators is more relevant for working points at lower photon energy, which are obtained using a higher magnetic field in the undulator. In this article we investigate the effect of error distribution in the K-parameter for a working point at 50 keV photon energy obtained injecting an electron beam with 16.5 GeV energy from the XFEL linear accelerator in a undulator line composed by SCUs with 1.6 T peak magnetic field.

Etched Silicon Planar CRL Optics for the High-Energy X-ray Diffraction Beamlines 11-ID-B and 11-ID-C at the APS

The focusing of high-energy X-rays is most commonly achieved by commercially available compound refractive lenses (CRL), which are added together in larger structures. There is a need for high-energy X-ray beamlines to enable focusing in only one dimension down to a few micrometers to study layered materials and thin films. High-energy X-rays above 50 keV require often 100 lenses or more, therefore it is more efficient to etch the complete arrays of lenses into a monolithic substrate like a silicon wafer. Custom lens arrays were fabricated for the high-energy x-ray beamlines 11-ID-B, and 11-ID-C at the Argonne National Laboratory. The fabrication required tuning parameters of the Bosch process to optimize the etching of deep vertical sidewalls at a reasonable speed without overheating. The beamline 11-ID-B is equipped with lens arrays of 85-110 lenses for 59 keV and 190-250 lenses for 87 keV photon energy, focusing the beam vertically below 5.0 µm at the sample positions between 1600 mm to 2100 mm. 11-ID-C has received arrays of 435 lenses that focus 106 keV X-rays to a vertical height of 2.0 µm at the sample position. In both cases, the flux density gain in the focal spot is larger than a factor of 20, relative to using slits to cut the beam size. The lens setup is permanently installed and can be moved in and out of the beam during the experiment without further alignment. The lenses have enabled operando diffraction studies on interfaces in batteries and the development of pair distribution function (PDF) analysis using grazing incidence geometry.

Circular Polarimetry of Hard X-rays with Rayleigh Scattering

We present a theoretical investigation of the elastic Rayleigh scattering of X-rays by atomic targets. Special attention is paid to the question of how the polarization of the scattered photons is affected if the incident light is itself polarized. In particular, we found that the circular polarization of the incoming X-rays may lead to a remarkable modification of the linear polarization of the scattered photons. Based on this ’circular-to-linear-polarization-transfer’ and on the fact that the linear polarization of X-rays can be conveniently observed by solid-state Compton detectors, we argue that Rayleigh scattering may be used as a tool for circular polarimetry of hard X-rays. To illustrate our proposal, we performed detailed calculations of 145 and 500 keV circularly polarized photons scattered by lead atoms. Based on these calculations, we found that the photon scattering under large angles with respect to the incident beam direction is most favorable for the circular polarimetry of hard X-rays. In particular, for 500 keV photon energy and scattering angles around 70 deg we found a remarkable modification of the linear polarization of scattered light for the case when the incident radiation is circularly polarized.

Achieving High-Resolution Hard X-ray Microscopy using Monolithic 2D Multilayer Laue Lenses

Abstract: This article introduces the 2D multilayer Laue lens (MLL) nanofocusing optics recently developed for high-resolution hard X-ray microscopy. The new optics utilized a micro-electro-mechanical-system (MEMS)-based template to accommodate two linear MLL optics in a pre-aligned configuration. Angular misalignment between the two lenses was controlled in tens of millidegrees, and the lateral position error was on a micrometer scale. Using the developed 2D MLLs, an astigmatism-free point focus of approximately 14 nm by 13 nm in horizontal and vertical directions, respectively, at 13.6 keV photon energy was obtained. The success of 2D MLL optics with an approaching 10 nm resolution is a significant step forward for the development of high-resolution hard X-ray microscopy and applications of MLL optics in the hard X-ray community.

Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry.

A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70-80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility.

Investigation of coherent/Compton scattering differential cross section ratios in Cu alloys as depending on chemical environment and scattering angle

In this study, seven alloys with a nominal composition of (CuO2)0.5 M0.5 (M = Fe, Co, Ni, Cu, Zn, Y, and Nb wt%) were produced via the powder mixed method. Alloys and pure metals were excited with 59.54 keV photon energy emitted from Am-241 radioactive source at 25°, 35°, 45°, 55°, 65°, 75′ and 85° scattering angles. The spectra of the coherent/Compton peaks were obtained by Si(Li) detector. First of all, chemical shift, (ΔE) peak energies, (E) asymmetry index (As) and full width half maximum (FWHM) values were found in the Compton/Coherent scattering spectra obtained depending on the scattering angle and the chemical environment of the transition metals. Then the ratios of the Coherent/Compton scattering differential cross-section (dσcoherent/dσCompton) were obtained experimentally. The experimental dσcoherent/dσCompton ratios of the selected 3d-4d transition metals were found to be compatible with the data in the literature. Asymmetry and chemical shifts were observed in almost all samples, especially in Compton peaks, with increasing scattering angles. The chemical shifts of Compton and Coherent peaks of the alloys were found in the range of 1–932 eV. The experimental dσkoherent/dσCompton ratios for the alloys obtained by adding Fe, Co, Ni, Cu, Zn, Y, and Nb to Cu2O were found as 0.697, 0.689 0.678, 0.698, 0.736, 0.755, 0.798, 0.835 at 45° scattering angle, respectively. It has been determined that the experimental dσcoherent/dσCompton ratio for each alloy increases with increasing atomic number, while it decreases with increasing scattering angle.