Radio-frequency sputtered Cu2ZnSnS4 (CZTS) thin films deposited on glass substrates were characterized. The film deposition was carried out in an argon atmosphere with RF powers of 200 W for zinc and 300 W for the CTS films. After the deposition, the films were annealed at temperatures ranging from 350 °C to 500 °C in a nitrogen and sulfur atmosphere. By using X-ray diffraction, the CZTS films were observed to crystallize in a tetragonal structure with some minor secondary phases in some samples. The absorption coefficient and optical band gap are identified by the ultraviolet-visible-near-infrared optical transmission measurements and the calculated band gap was found to range between 1.4 eV and 1.51 eV. This research comprehensively addresses the effects of layer thickness and annealing temperature on our CTS/Zn films. The annealing process was oberved to result in a significant improvement in electrical conductivity, particularly in films without secondary phases.
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