One of the most important factors for optimizing the X-ray emission from a plasma focus device is the use of pre-ionization before triggering the device. In this paper, we investigated the effect of pre-ionization on Cu Kα and total X-ray emission from a Mather-type plasma focus device. The Cu Kα and total X-ray yield is measured as a function of the deuterium-filling pressure by using PIN-diode detectors. The maximum Cu Kα emission is found to be 1.95 J for the α-source and 1.62 J without the α-source, with corresponding average efficiencies of 0.049 and 0.06% without and with the α-source, respectively. The maximum total X-ray yield in 4π geometry is estimated to be about 2.64 and 2.12 J, with corresponding efficiencies of about 0.08 and 0.064% with and without the α-source, respectively.
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