physica status solidi (a)Volume 59, Issue 1 p. K69-K74 Short Note Influence of surface electric field on the MOS capacitance of n-channel inversion layers in small gap semiconductors D. R. Choudhury, D. R. Choudhury Institute of Radio Physics and Electronics, University College of Science and Technology, Calcutta Search for more papers by this authorA. K. Chowdhury, A. K. Chowdhury Institute of Radio Physics and Electronics, University College of Science and Technology, Calcutta On leave of absence from the Department of Physics, Patna University, Patna, India.Search for more papers by this authorA. N. Chakravarti, A. N. Chakravarti Institute of Radio Physics and Electronics, University College of Science and Technology, Calcutta Search for more papers by this author D. R. Choudhury, D. R. Choudhury Institute of Radio Physics and Electronics, University College of Science and Technology, Calcutta Search for more papers by this authorA. K. Chowdhury, A. K. Chowdhury Institute of Radio Physics and Electronics, University College of Science and Technology, Calcutta On leave of absence from the Department of Physics, Patna University, Patna, India.Search for more papers by this authorA. N. Chakravarti, A. N. Chakravarti Institute of Radio Physics and Electronics, University College of Science and Technology, Calcutta Search for more papers by this author First published: 16 May 1980 https://doi.org/10.1002/pssa.2210590169Citations: 6 92, Acharya P. C. Road, Calcutta 700009, India. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume59, Issue116 May 1980Pages K69-K74 RelatedInformation