Integrated Computer Aided Manufacturing Definition Research Articles

Business Process Modeling for Semiconductor Production Risk Analysis Using IDEF0

Program managers must manage heterogeneous sources of risk across the semiconductor lifecycle, identifying vulnerabilities that, if exploited, have adverse consequences to mission and/or business objectives. Identification of sources of risk involves understanding the business processes involved in the production, use, and maintenance of components. Business process modeling is widely used to address technology research and development. A typical methodology for business process modeling is the ICAM (integrated computer-aided manufacturing) DEFinition (IDEF) family of modeling languages. The basic IDEF0 block represents a function, with associated inputs, outputs, controls, and mechanisms. This article demonstrates risk identification and risk management through the use of an extended IDEF0 framework incorporating risk sources. The effort models the semiconductor lifecycle based on open-source materials at multiple hierarchical levels, for example, drilling down into fabrication and wafer manufacturing processes. Product lifecycle stages are associated with particular sources of risk. Several sources of risk are pervasive across stages while others are particular to a stage. The results of this effort help program and product managers to know what risks should be managed, how risk countermeasures and resources should be coordinated, and how the performance of risk management activities should be monitored and evaluated.

A Green Cooperative Development Method Based on the IDEF0 Model of Manufacturing Knowledge: Case Study of a Carton-Filling Machine

This is a case study of cooperative development between a college and a corporation to manufacture a carton-filling machine. Specifically, a green cooperative development method was proposed that would match the college’s design capabilities with the manufacturing capacity of the enterprise. This college–enterprise cooperative development represents an extensive collaboration between industry and academia. This method integrates design for manufacturing (DFM) theory and the integrated computer aided manufacturing definition (IDEF) method to establish the IDEF0 (functional) model of manufacturing knowledge that supports the design process. The model clarifies the specific manufacturing knowledge that enterprises should provide at the conceptual design stage, preliminary design stage and detailed design stage. The forms of communication and timing of knowledge provision needed to optimize development planning and design decisions based on the manufacturing capacity of the enterprise were also determined. Through this method, the college–enterprise cooperative development project (in this case, involving a carton-filling machine) was accomplished with less time, fewer design modifications and fewer parts needing to be reworked. The results show that this method can greatly reduce the run-in period of both parties, improve the efficiency of cooperative development and reduce the cost and waste of prototyping.

Key improvement decision analysis mechanism based on overall loss of a production system

ABSTRACT Business operations must effectively utilize real-time information presented by the manufacturing execution system for the identification and analysis of key improvements, finite resources can be put to better use, and implement effective quality improvements. This study analyzed overall loss through time loss, performance loss, and material loss by expanding the manufacture value process. Overall process loss (OPL) and overall line loss (OLL) were developed as indexes to select key improvement targets. First, Pareto analysis was used to identify process. The ICAM (Integrated Computer Aided Manufacturing) Definition (IDEF) was then employed to inform improvement decisions regarding the loss item. Finally, new key improvement goals were identified from the updated OLL, with continual improvement. The contributions of this study are the development of the indexes, OPL and OLL, based on overall loss, the improvement decision model, and the construction of a mechanism whereby sustainable reduction of overall loss can be achieved.

Knowledge representation and data management of ontology-based vessel man-machine-environment system

Application of human factors in vessel design is important for improving the performance, safety and habitability of vessel. This research focuses on the knowledge representation of human factors in vessel man-machine-environment system by utilising ontology for data management. Using integrated computer-aided manufacturing definition (IDEF), a framework is developed to reveal the internal relationships between different application tasks. Based on these relationships, ontology is utilised to represent the knowledge of application process. Web ontology language (OWL) is used to develop the syntax for the knowledge representation. Protege is used to build the ontology model. JAVA-based API is developed to immerge the knowledge data into MySQL to construct an ontology database. An application scenario of a supply transportation task is implemented to show how to manage these ontology data. Using ontology building and data management method, application knowledge can be accumulated and reused. This sets foundation for intelligent vessel human factors applications.

Construction of Cutting Tool Life-cycle Information Management Platform

To improve process capability in manufacture industry, the information of cutting tool life-cycle is vital. The cutting tool life-cycle management was presented. Some key technologies were investigated, including cutting tool resource classification and code technology, etc.. Further more, the cutting tools life-cycle management system was analyzed and designed through IDEF (Integrated computer aided manufacturing definition method ) methodology, and then the key page of TLMS (tool life-cycle management system) was employed according to J2EE (java 2 platformenterprise edition (j2ee)) mode. The information management platform of the cutting tool life-cycle is an effective way to solve its shortage of resources during manufacture.

Enhancement of process capability for strip force of tight sets of optical fiber using Taguchi’s Quality Engineering

Strip force is the key to identifying the quality of product during manufacturing tight sets of fiber. This study used Integrated computer-aided manufacturing DEFinition 0 (IDEF0) modeling to discuss detailed cladding processes of tight sets of fiber in transnational optical connector manufacturing. The results showed that, the key factor causing an instable interface connection is the extruder adjustment process. The factors causing improper strip force were analyzed through literature, practice, and gray relational analysis. The parameters design method of Taguchi’s Quality Engineering was used to determine the optimal experimental combinations for processes of tight sets of fiber. This study employed case empirical analysis to obtain a model for improving the process of strip force of tight sets of fiber, and determines the correlation factors that affect the processes of quality for tight sets of fiber. The findings indicated that, process capability index (CPK) increased significantly, which can facilitate improvement of the product process capability and quality. The empirical results can serve as a reference for improving the product quality of the optical fiber industry.

A systems approach to electronic assembly optimization

There are many complex problems in the optimization of an electronics manufacturing environment, and it is the view of the authors that these problems should not be solved and optimized in isolation but analysed in the framework of a system. A systems approach offers an overall approach for solving problems, optimizing the whole of the system rather than discrete subsystems. The research introduced in this paper integrates several techniques, namely integrated computer aided manufacturing definition, experimental design and response surface methods for the analysis, control and optimization of electronic manufacturing processes. Electronics manufacturing includes three major processes: printed circuit board manufacturing, semiconductor device manufacturing and electronics assembly. This paper describes a generic systematic model for optimizing electronic assembly. Computer aided systems engineering methodology is introduced and a description of how this was applied to optimize electronic assembly within a manufacturing company using historical data is given together with a process map for electronic assembly. An analysis of the overall assembly operation is then used to generate the relationship between overall yield and yield of the subprocesses.

IDEF based methodology for rapid data collection

In recent years, computer simulation has become a mainstream decision support tool in manufacturing industry. In order to maximise the benefits of using simulation within businesses simulation models should be designed, developed and deployed in a shorter time span. A number of factors, such as excessive model details, inefficient data collection, lengthy model documentation and poorly planned experiments, increase the overall lead time of simulation projects. Among these factors, input data modelling is seen as a major obstacle. Input data identification, collection, validation, and analysis, typically take more than one‐third of project time. This paper presents a IDEF (Integrated computer‐aided manufacturing DEFinition) based approach to accelerate identification and collection of input data. The use of the methodology is presented through its application in batch manufacturing environments. A functional module library and a reference data model, both developed using the IDEF family of constructs, are the core elements of the methodology. The paper also identifies the major causes behind the inefficient collection of data.

A systems approach to photolithography process optimization in an electronics manufacturing environment

There are many complex problems in the optimization of an electronics manufacturing environment, and it is the view of the authors that these problems should not be solved and optimized in isolation, but analysed in the framework of a system. A systems approach offers an overall approach for solving problems, and optimizing the whole of the system as well as discrete subsystems. The research introduced in this paper integrates several techniques, namely: Integrated computer aided manufacturing DEFinition (IDEF), and experimental design and response surface methods for the analysis, control and optimization of electronic manufacturing processes. Electronics manufacturing includes three major processes; Printed Circuit Board (PCB) manufacturing, semiconductor device manufacturing and electronics assembly. This paper describes a novel generic systematic methodology that has been used to create a model to optimize the photolithography process in PCB manufacture. For this, photolithography has been considered as a whole system made up of several sub-systems. This is shown in the process map for PCBs that focuses on photolithography and its subprocesses. A model of the manufacturing process is then given with the results of this being validated using an industrial study. Optimized settings for processing equipment are given resulting in an increase in process yield within industry.

Methodology for rapid identification and collection of input data in the simulation of manufacturing systems

Computer simulation is a well-established decision support tool in the manufacturing industry. The rapid development and deployment of simulation models however, are inhibited by factors such as inefficient data collection, lengthy model documentation, and poorly planned experimentation. Typically, more than one third of project time is spent on identification, collection, validation, and analysis of input data. Whilst most research work has been focused on statistical techniques for data analysis, less attention has been paid to the development of systematic approaches to input data gathering. This paper presents a methodology for rapid identification and collection of input data in batch manufacturing environments. A functional module library and a reference data model, both developed using the IDEF (Integrated computer aided manufacturing DEFinition) family of constructs, are the core elements of the methodology. The paper also identifies the major causes behind the inefficient collection of data.

Research communications

Presents a simulation model of the “Contract change process” for an aerospace manufacturing firm. The model was developed to simulate the activities from the time when a customer’s request is received to the two points in time where a preliminary schedule and a formal proposal is returned to the customer. The model was developed in a two‐stage approach. First, the process was studied and documented in US Air Force integrated computer aided manufacturing definition language for function modeling an IDEF0 model which defined the relationships between each pair of activities. Second, using the structural information provided by the IDEFo model, a simulation model using simulation language for alternative modeling (SLAMII) was developed. Data were obtained from archival sources in the department’s database. The data were analyzed according to the quarter in which they were received. From this, arrival time data distributions were estimated for each of the four quarters to capture the seasonality element in the company’s business. Next, the data were separated into three levels of difficulty to define complex, routine and simple tasks. From this, three distributions of activity times were developed for each set of tasks. The results will allow for the study of reengineering and downsizing decisions for the contract change process in the aerospace industry, under conditions of seasonal and task complexity variations.

Design and Development of an Architecture for Computer-Integrated Manufacturing in the Apparel Industry

To be successful and competitive and achieve excellence in manufacturing, the textile/apparel industry must successfully use the most advanced concepts and meth ods, including computer-integrated manufacturing (CIM). Successful implementation of CIM requires a fundamental analysis of the three major facets of the apparel en terprise : function, information, and dynamics. We discuss the concept of an architecture for apparel manufacturing, which will serve as the blueprint for implementing CIM. We present the various methodologies for developing the architecture, as well as a detailed disc on of the U.S. Air Force's integrated computer-aided manufacturing definition (IDEF). We also propose specific criteria for evaluating methodologies and software for developing the architecture.

The Use of IDEFo to Link Design and Manufacture in a CIM Environment

International competition is driving manufacturing executives to place an ever‐growing importance on the formulation of computer integrated manufacturing (CIM) strategies as part of their corporate plans. Structured analysis and design techniques, in particular IDEF (Integrated Computer Aided Manufacturing definition method), are becoming a vital tool in the analysis and implementation of such CIM strategies. This article positively demonstrates the technique and its ability to model the link between design and manufacture in a CIM environment. The approach relates interdependencies of planning for manufacture, design and process planning within a CIM strategy. In particular it establishes the position of computer aided process planning (CAPP) in CIM architecture and evaluates a CAPP package as a potential element of a CIM strategy. The application to which IDEFo, in particular, has been used clearly demonstrates its usefulness to manufacturers as a powerful aid to the development of detailed CIM strategies.

A methodology to model the functional structure of an organization

The Integrated Computer Aided Manufacturing (ICAM) program of the U.S. Air Force identified a need to better communicate and analyze manufacturing for the people involved in improving productivity. To satisfy that need, the ICAM program developed the IDEF (ICAM Definition) method to address particular characteristics of manufacturing. This IDEF Method is equally applicable in analyzing other types of organizations. IDEF comprises of three modeling methodologies: Function model methodology (IDEF 0), Information model methodology (IDEF 1) and Dynamics model methodology (IDEF 2). This paper reports on the function model methodology only. This methodology is used to construct a function model which helps in understanding the actions, activities, decisions, and informational interfaces needed to support the functions of an organization.

Requirement definition architecture—an overview

The Integrated Computer Aided Manufacturing (ICAM) program of the U.S. Air Force identifieda need to better communicate and analyze manufacturing for the people involved in improving productivity. To satisfy that need, the ICAM program developed the IDEF (ICAM Definition) method to address particular of Manufacturing. This IDEF Method is equally applicable in analyzing other types of organizations. IDEF comprises of three modeling methodologies: Function model methodology (IDEF 0), Information model methodology (IDEF 1) and Dynamics model methodology IDEF 2). This paper presents and overview of each of the methods. In addition, a life cycle for Information Systes Development is developed to utilize the methods. Step by step procedures and examples are also presented.

A methodology to model the information structure of an organization

The Integrated Computer Aided Manufacturing (ICAM) program of the U.S. Air Force identified a need to better communicate and analyze manufacturing for the people involved in improving productivity. To satisfy that need, the ICAM program developed the IDEF (ICAM Definition) method to address particular characteristics of manufacturing. This IDEF method is equally applicable in analyzing other types of organizations. IDEF comprises three modeling methodologies: function model methodology (IDEF 0), information model methodology (IDEF 1) and dynamics model methodology (IDEF 2). This paper reports on the Information model methodology only. This methodology is used to construct an information model that helps in understanding the structure of information needed to support the functions of an organization.

A methodology to model the Dynamic structure of an organization

The Integrated Computer Aided Manufacturing (ICAM) program of the U.S. Air Force identified a need to better communicate and analyze manufacturing for the people involved in improving productivity. To satisfy that need, the ICAM program developed the IDEF (ICAM Definition) method to address particular characteristics of manufacturing. This IDEF Method is equally applicable in analyzing other types of organizations. IDEF comprises of three modeling methodologies: function model methodology (IDEF 0), information model methodology (IDEF 1) and dynamics model methodology (IDEF 2). This paper reports on the dynamics model methodology only. This methodology is used to construct models which help in understanding the Dynamic (time-varying behavior) structure which the functions of an organization exhibit.