Point-projection microscopy is an attractive surface imaging modality. High magnification, resolution, and contrast are easily achieved by radially projecting charged particles from a specimen mounted several centimeters in front of an imaging detector within a vacuum environment. Stigmation, drift and alignment problems are negligible, or nonexistent. The trick is to generate charged particles at or near the surface of the specimen that must coincide with the surface of a smoothly curved, conducting electrode of radius R. A potential difference applied between this electrode and a counter electrode, coincident with the detector surface, accelerates the charged particles radially into space. When the charged particles reach the detector they will have magnified their point of origin at the specimen surface by ∼D/R, where D is the separation of the electrodes. For D ∼10 cm and R ∼100 nm, the magnification is ∼106. If the particles have a forward velocity much greater than their lateral velocity (and a small DeBroglie wavelength), a highly resolved image of the specimen surface will appear at the detector.