This paper introduces, for the first time, an extended modal integral technique for reliable characterization of multilayered symmetrical/asymmetrical planar structures built on arbitrary number of uniaxial electric/magnetic anisotropic layers. Based on a simple but efficient recursive algorithm devoted to composite substrates, the proposed hybrid mode analysis involves the Galerkin’s procedure combined with the formalism concept of mathematical operators to more conveniently formulate the boundary conditions. By properly selecting adequate trial functions, the technique was demonstrated through a close agreement between the obtained results and published data.
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