In this article we report on the magnetic and transport properties of FexRh1−x thin films, prepared by evaporation in high vacuum, in the composition range 0.41<xFe<0.59. Upon annealing (at a temperature of 870 K or higher) a certain volume fraction transforms to the ordered CsCl-type (α′) FeRh phase. Close to room temperature this phase shows a hysteretic transition between the antiferromagnetic (AF) and the ferromagnetic (F) state for samples with xFe<0.5, which gives rise to a magnetoresistance (MR) effect. Although the magnetic transition was never found to be complete, it is shown that the full MR ratio can be obtained by extrapolation of the measured MR ratio as a function of the relative change of the magnetization at the transition. The AF→F transition is only observed for films with xFe<0.505±0.015, for which the α′ phase with this (fixed) composition is present together with a nonmagnetic Rh-rich fcc-type phase, as is shown from a combination of x-ray diffraction, Mössbauer spectroscopy, and magnetization studies. This observation, which was not expected from the phase diagrams available from the literature, can explain our finding that the full MR ratio observed for films in this compositional range is independent of the Fe content. The full MR ratio is 85±6% at room temperature, which is very close to the MR ratio observed for bulk FeRh, implying a high structural quality of the films grown. X-ray diffraction and transmission electron microscopy were used to quantify microstructural aspects such as the grain diameter and strain. The highest MR ratio actually observed is 58%, in a 4400 kA/m field at 275 K. The full MR increases to approximately 150% at 250 K, and, as estimated from the resistivity of F and predominantly AF samples with almost the same composition, to 680±100% at 4.2 K.
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