X-ray computed tomography (XCT) provides a unique set of dimensional measurement capabilities suitable for assessing complex geometry. However, due to the origins of XCT as a medical imaging method and qualitative non-destructive examination technique, only recently has XCT been rigorously investigated as a dimensional metrology tool. Although the data produced via XCT may be leveraged with conventional coordinate metrology techniques, the instrument physics and volumetric reconstruction methods which govern the accuracy and precision of the data are complex, workpiece-specific, and non-negligible. In particular, there is minimal prior work which has studied complex multi-step metrology tasks such as datum reference frame (DRF) construction and feature position measurement. In this work, a qualified artifact was used to evaluate the fitness of XCT for such a task. Multiple XCT systems were used, and multiple instrument magnification levels compared. The form error of planar and cylindrical features was evaluated. Further, the influence of individual feature reconstruction on the development of datums and upstream position measurements was studied. It was found that negative, i.e., bore-like, and positive, i.e., pin-like configurations of certain features were subject to distinct XCT artifact effects which caused upstream measurement errors when these features were used to construct a DRF. High magnification and X-ray scatter produced high spatial frequency noise in surface reconstruction while beam hardening and beam penetration distance variation produced gross apparent form error. The latter was associated with greater measurement errors in feature position measurement within an DRF.