For the production of HTS coated conductor devices, NiV and NiCr (Ni-based alloys) are the most important, non-magnetic, high strength and biaxially textured substrates developed from pure Ni. The Ni 88 V 12 and Ni 85 Cr 15 (at. %) alloys have been melted in Plasma Arc Furnace and textured tapes have been prepared, after heavy cold rolling, by recrystallization heat treatment under high vacuum. The suitable working conditions have been found to obtain not only the {100} <001> cube texture but also the correct grain shape and size for the following deposition process. Out of plane orientation of these substrates has been investigated by θ-2θ X-ray diffraction measurements and in plane orientation study has been completed by pole figures. The microstructure has been observed by optical microscopy: it has been carried out on samples obtained after an annealing treatment (Grain Size Adjustment) and on recrystallized samples in different conditions. As preliminary mechanical investigation the microhardness values have been detected for each step of the working procedure. The accuracy of the cubic texture and the grain structure are affected by the processing condition, in particular the temperature of the GSA seems a very important parameter which influences the final characteristics of the tapes.