Harmonic Piezoresponse Force Microscopy Research Articles

Design and implementation of sequential excitation module for high fidelity piezoresponse force microscopy

The acquisition of accurate information through a contact resonance mode is critical for mapping weak electromechanical effect reliably by using piezoresponse force microscopy (PFM). However, it is very challenging to track resonance frequency shifting when the contact stiffness from the sample varies significantly. In this work, we have developed a sequential excitation (SE) module to enable high fidelity PFM. A customized discrete frequency sweep signal from an arbitrary waveform generator is used for drive excitation so that resonance frequency tracking is no longer necessary. Furthermore, the AC component of the piezoresponse is sampled by using an oscilloscope instead of using lock-in amplifiers. To accommodate high volume of data acquisition, a fast analysis method is also developed to fit the transfer function of the cantilever efficiently on the fly during scanning. Hardware implementation and data processing are described in detail. The capability of our SE module has been demonstrated on an ordinary PMN-PT film via first and second harmonic PFM, as well as a suspended freestanding MoS2 membrane that is very challenging to probe due to its substantial variation in contact stiffness.

Ferroelectric-Paraelectric Phase Transition in Triglycine Sulphate via Piezoresponse Force Microscopy

Triglycine sulphate (TGS) is a widely studied ferroelectric material due to its high pyroelectric coefficients and pure 2nd order phase transition of the order-disorder type. In this work, we report local piezoelectric properties and domain evolution in TGS via piezoresponse force microscopy (PFM) where the ferroelectric-paraelectric phase transition and its domain structure are visualized in a single image while slowly heating the crystal during scanning. Thus, the y-coordinate of the scan represents the temperature and serves as a temperature “lens” to zoom in peculiarities of the domain evolution and paraelectric-ferroelectric phase boundary. Strong shift of the Curie point and broad peak of the second harmonic PFM signal are rationalized in terms of the stabilization of ferroelectric phase at the surface and large contribution of the dielectric constant to the local electromechanical measurements.

Direct observation of fatigue in epitaxially grown Pb(Zr,Ti)O3 thin films using second harmonic piezoresponse force microscopy

Here, we present a direct observation of fatigue phenomena in epitaxially grown Pb(Zr0.2Ti0.8)O3 (PZT) thin films using second harmonic piezoresponse force microscopy (SH-PFM). We observed strong correlation between the SH-PFM amplitude and phase signals with the remnant piezoresponse at different switching cycles. The SH-PFM results indicate that the average fraction of switchable domains decreases globally and the phase delays of polarization switching differ locally. In addition, we found that the fatigue developed uniformly over the whole area without developing region-by-region suppression of switchable polarization as in polycrystalline PZT thin films.