It is well known that the internal stress in electrodeposited metals is varied by the electrolytic conditions and the internal stress effects on some properties of the electrodeposited metals.Therefore, it is important to measure the internal stress in electrodeposited metals. Hitherto, many workers have developed the methods to measure the internal stress in electrodeposited metals. The principles of those methods are based on the measurement of deflection of a thin strip or a spiral helix which is electrodeposited on the one side. These methods do not give a direct information on the lattice deformation in electrodeposited metals.The X-ray diffraction methods are expected to give more exact information on the lattice distortion in electrodeposited metals. Recently, a number of X-ray diffraction methods for stress measurements have been developed in the field of the testings for metallic materials. The authors applied these X-ray diffraction methods to measure the internal stresses in electrodeposited chromium. In order to measure the internal stress of the first type (macro stress) in electrodeposited chromium by Sin2ψ method, the authors modified an ordinary diffractometer to be fulfilled the following conditions: (1) the specimen axis can be fixed at an arbitrary angle, the receiving slit and the GM tube being made to scan. (2) the receiving slit and the GM tube can be slided precisely to the focusing point in the radial direction of the goniometer which corresponds to the value of ψ0. The errors in this stress measurement which is apt to be caused by the sliding of the receiving slit and the GM tube were determined at 2θ=0°, and the influence of deviation in the position of the receiving slit from the focusing point on the measured value of stress was discussed by measuring the stress free iron powder. In measuring the internal stress of the second and third type (micro strains) in the electrodeposited chromium, the half-value breadth of several diffraction lines were measured by using Cu-Kα radiation and Hall's equation was applied to determine the micro strains.The chromium was plated on annealed copper plate from a bath containing CrO3:250g/l, H2SO4:2.5g/l and current density was 60A/dm2. The range of thickness of the deposits was from 10 to 30μ.From the experimental results, the following conclusions were derived.(1) It was confirmed to be possible to measure accurately the internal stress of the first type by using the modified diffractometer.(2) It was found that the internal stress of the first type in electrodeposited chromium measured by Sin2ψ methed on (211) diffraction line with Cr-Kα radiation was tensile stress at bath temperature range of 40-65°C, and the stress decreased with increasing bath temperature, and above 70°C the stress was compressive stress.(3) The half-value breadth of (211) diffraction line with Cr-Kα1 radiation decreased with increasing bath temperature from 40°C to 75°C.(4) It was found that the internal stress of the second and third type was a maximum at bath temperatures of 40-50°C. This tendency corresponded to the results of deflection obtained by a thin strip contractometer which showed a maximum value at bath temperatures of 40-50°C.