A theory of the electronic structures of periodic N1×N2 GaAs/AlxGa1−xAs superlattices grown along the [111] direction is presented. Deep levels associated with s- and p-bonded substitutional impurities in these superlattices are also predicted. It is found that: (i) in contrast with [001] superlattices, [111] superlattices are almost always direct band-gap superlattices. (ii) The [111] superlattices exhibit weaker quantum-well confinement than the corresponding [001] superlattices. (iii) As the thickness, t(GaAs), of each GaAs layer is reduced below a critical value (tc ≂13 Å or N1≂4 for x=0.7iii), common shallow donor impurities such as Si cease donating electrons to the conduction band and instead become deep traps. For [111] superlattices tc is smaller than the corresponding tc for [001] superlattices. The fundamental band gap and the band edges of the superlattice, and hence the ionization energies of deep levels, depend strongly on the layer thickness t(GaAs) but only weakly on t(AlxGa1−xAs). The T2- and A1-derived deep levels (of the bulk point group Td) are split and shifted, respectively, near a GaAs/AlxGa1−xAs interface: the p-like T2 level splits into an a1 ( pσ-like) level and a doubly degenerate e ( pπ -like) level of the point group for any general superlattice site (C3v), whereas the s-like A1 bulk level becomes an a1 (s-like) level of C3v. The order of magnitude of the shifts and splittings of deep levels at a GaAs/AlxGa1−xAs interface is less than 0.1 eV, depends on x, and becomes very small for impurities more than ≂3 atomic planes away from an interface. These predictions are based on a periodic superslab calculation for unit superslabs with total thickness t(GaAs)+t(AlxGa1−xAs) as large as 65.3 Å or N1+N2=20 two-atom-thick layers. The Hamiltonian is a tight-binding model in a hybrid basis that is a generalization of the Vogl model and properly accounts for the nature of interfacial bonds. The deep levels are computed using the Hjalmarson et al. theory [Phys. Rev. Lett. 44, 810 (1980)] and the special points method.