Function Of Gate Voltage Research Articles

Temperature dependence of the low-frequency noise in AlGaN/GaN fin field effect transistors

Low-frequency (LF) noise measurements are compared for Schottky-gate AlGaN/GaN heterostructure planar and fin field-effect transistors (FinFETs) as functions of gate voltage and measuring temperature. The noise of each device type is consistent with a carrier number fluctuation model. Similar effective defect-energy Eo distributions are derived for each of the two device architectures from measurements of excess drain-voltage noise-power spectral density vs temperature from 80 to 380 K. Defect- and/or impurity-related peaks are observed in the inferred energy distributions for Eo < 0.2 eV, Eo ≈ 0.45 eV, and Eo > 0.6 eV. Significant contributions to the LF noise are inferred for nitrogen vacancies and ON and FeGa impurity complexes. Ga dangling bonds at fin interfaces with gate metal are likely candidates for enhanced noise observed in FinFETs, relative to planar devices. Reducing the concentrations of these defects and impurity complexes should reduce the LF noise and enhance the performance, reliability, and radiation tolerance of GaN-based high electron mobility transistors.

Spintronic device in SWCNT-FET configuration based on chromium oxides thin films consisting of half-metallic ferromagnetic CrO2

Spintronic device architectures consisting of ferromagnetic chromium oxide electrodes in single-walled carbon nanotubes field effect transistor (SWCNT-FET) configuration have been fabricated to act as strategic building blocks for next generation super-compact high-speed nanoelectronic devices for logic and memory operations. Stable thin films of chromium oxides consisting of half-metallic ferromagnetic chromium-di-oxide (CrO2) were pulsed laser deposited (PLD) over lattice-matched rutile-type-tetragonal intermediate TiO2 thin layers over thermally oxidized Si substrates for engineering of the spintronic device structure. Focused ion beam (FIB) milling was applied to the ferromagnetic chromium oxide thin films for patterning of the source (S) and (D) electrodes. Typical electrical characteristics derived by lnρ vs. T−1/2 plots confirmed spin-dependent transport (SDT) as the dominant mechanism of electrical conduction upto temperatures of ∼280 K along with negative magnetoresistance (MR) of ∼30 % at 278 K. Electrical characteristics (output and transfer) of the spintronic device structure were drawn under application of magnetic field (H) in out-of-plane geometry at the temperatures of 5.6 K, 250 K & 300 K. Drain current (Id) is demonstrated to be controlled effectively as a function of gate bias (Vg) for different fixed Vd-biases at all the device operating temperatures. Change in %MR as a function of gate voltage (Vg) was acquired at T = 250 &T = 300 K that displayed higher %MR change under out-of-plane geometry of applied field of 0.75 T of the spintronic device operation.

Nonvolatile Memristive Effect in Few-Layer CrI3 Driven by Electrostatic Gating.

The potential of memristive devices for applications in nonvolatile memory and neuromorphic computing has sparked considerable interest, particularly in exploring memristive effects in two-dimensional (2D) magnetic materials. However, the progress in developing nonvolatile, magnetic field-free memristive devices using 2D magnets has been limited. In this work, we report an electrostatic-gating-induced nonvolatile memristive effect in CrI3-based tunnel junctions. The few-layer CrI3-based tunnel junction manifests notable hysteresis in its tunneling resistance as a function of gate voltage. We further engineered a nonvolatile memristor using the CrI3 tunneling junction with low writing power and at zero magnetic field. We show that the hysteretic transport observed is not a result of trivial effects or inherent magnetic properties of CrI3. We propose a potential association between the memristive effect and the newly predicted ferroelectricity in CrI3 via gating-induced Jahn-Teller distortion. Our work illuminates the potential of 2D magnets in developing next-generation advanced computing technologies.

N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors

Image sensors such as single-photon avalanched diode (SPAD) arrays typically adopt in-pixel quenching and readout circuits, and the under-illumination first-stage readout circuits often employs high-threshold input/output (I/O) or thick-oxide metal-oxide-semiconductor field-effect transistors (MOSFETs). We have observed reliability issues with high-threshold n-channel MOSFETs when they are exposed to strong visible light. The specific stress conditions have been applied to observe the drain current (Id) variations as a function of gate voltage. The experimental results indicate that photo-induced hot electrons generate interface trap states, leading to Id degradation including increased off-state current (Ioff) and decreased on-state current (Ion). The increased Ioff further activates parasitic bipolar junction transistors (BJT). This reliability issue can be avoided by forming an inversion layer in the channel under appropriate bias conditions or by reducing the incident photon energy.

Performance Analysis of Electrochemical Detection Platform for DNA Hybridization Using TGN-Based Nanobiosensor

Trilayer graphene nanoribbon (TGN) has great potential in related biomedical applications such as drug and gene delivery and deoxyribonucleic acid (DNA) sensing. The performance of a biosensor based on a liquid gate TGN field effect transistor (Lg-TGNFET) to different DNA cancentrations and adsorption effect on the sensing parameters are analytically investigated in this research. Also, the energy band structure, density of states, carrier concentration, electrical conductance and caused electrical response on TGN as a detection element are studied considering the spin–orbit coupling effect, in which significant current change of the TGN-based biosensor is observed after exposure to DNA different values. DNA concentration as a function of gate voltage is assumed and sensing factor is defined. The results of this research confirm that the current of the biosensor is decreased and Vg-min is obviously left-shifted by increasing value of DNA concentration, suggesting that DNA molecules n-dopes the TGN film. In order to verify the accuracy of the TGN-based biosensor, it is compared with recent analytical and experimental reports on DNA biosensors. The proposed biosensor with high specificity and sensitivity exposes higher current compared to that of monolayer graphene counterpart for analogous ambient conditions.

Single‐layer thin‐film transistor analysis and design

AbstractA set of direct current (DC) analytical equations is formulated for the analysis and design of a single‐layer thin‐film transistor (TFT). For a specified TFT structure, drain current is calculated as a function of drain and gate voltage (taking the source as ground) according to the Enz, Krummenacher, Vittoz (EKV) compact model. One model parameter function is required to implement this EKV‐based equation, that is, drift mobility as a function of gate voltage. Drift mobility is evaluated as a consequence of accumulation layer electrostatics assessment of the TFT structure specified. In order to implement the model, three semiconductor properties (low‐frequency (static) relative dielectric constant, free electron concentration, and maximum (no trapping) mobility), two structure properties (insulator capacitance density and TFT width‐to‐length ratio), and one physical operating parameter (temperature) must be specified. Optimal TFT mobility performance is achieved when the thickness of the semiconductor channel layer is constrained to be less than 2.22 times the channel layer Debye length such that “short‐base” TFT operation obtains. Additionally, higher mobility TFT performance is obtained by selecting a channel layer with a small electron effective mass, reducing channel layer trap density, reducing channel layer thickness, reducing the free electron concentration, and/or increasing gate capacitance density.

Demonstration of the Nonlocal Josephson Effect in Andreev Molecules.

We perform switching current measurements of planar Josephson junctions (JJs) coupled by a common superconducting electrode with independent control over the two superconducting phase differences. We observe an anomalous phase shift in the current-phase relation of a JJ as a function of gate voltage or phase difference in the second JJ. This demonstrates the nonlocal Josephson effect, and the implementation of a φ0-junction which is tunable both electrostatically and magnetically. The anomalous phase shift is larger for shorter distances between the JJs and vanishes for distances much longer than the superconducting coherence length. Results are consistent with the hybridization of Andreev bound states, leading to the formation of an Andreev molecule. Our devices constitute a realization of a tunable superconducting phase source and could enable new coupling schemes for hybrid quantum devices.

Accurate Field‐Effect Mobility and Threshold Voltage Estimation for Thin‐Film Transistors with Gate‐Voltage‐Dependent Mobility in Linear Region

AbstractThe measurement of mobility and threshold voltage in thin‐film transistors (TFTs) in which the mobility is a function of gate voltage or carrier density is usually done inaccurately. Herein, accurate mobility calculations within the framework of the gradual channel approximation are described. Conventionally, the derivative of drain current with respect to gate voltage is often used to calculate mobilities in the linear region. This procedure often leads to errors when the mobility is not constant. Using a first‐order finite difference‐based calculations, it is shown how the correct field‐effect mobility can be extracted. The corrected mobility can be smaller than the conventionally calculated field‐effect mobility by up to a factor of 2. It is also shown that the corrected field‐effect mobility is identical to the average mobility. A threshold voltage that is independent of gate voltage value and suitable for disordered semiconductors is used for more accurate mobility calculations. The mobility and threshold voltage calculations are illustrated with experimental data from multiple TFTs with indium gallium zinc oxide, zinc tin oxide, and molybdenum disulfide channel layers.

Energy distribution controlled ballistic Josephson junction

We report an experimental study on the tuning of supercurrent in a ballistic graphene-based Josephson junction by applying a control voltage to a transverse normal channel. In this four-terminal geometry, the control voltage changes the occupation of Andreev states in the Josephson junction, thereby tuning the magnitude of the supercurrent. As a function of gate voltage, we find two different regimes characterized by a double-step distribution and a hot-electron distribution, respectively. Our work opens new opportunities to design highly controllable Josephson junctions for tunable superconducting quantum circuits.

(Invited) Thin-Film Transistor Accumulation-Mode Modeling

Analytical equations are developed for electrostatic assessment of accumulation-mode thin-film transistors (TFTs) so that potential, electric field, and accumulation layer free electron concentration profiles may be generated. Additionally, equations are derived for plotting TFT trap density versus surface potential, based on accurate extraction of the channel mobility as a function of gate voltage. A key factor in formulating these device physics equations is distinguishing between a ‘long-base’ or ‘short-base’ channel thickness. A ‘long-base’ (‘short-base’) channel thickness is defined to occur when the accumulation layer thickness (as calculated in the normal manner) is less than (greater than) the physical thickness of the channel layer. The electrostatic equations derived herein are applied to the analysis of two amorphous oxide semiconductor (AOS) TFTs with differing channel layers, i.e., a 40 nm amorphous indium gallium zinc oxide (a-IGZO) or a 7 nm amorphous indium zinc oxide (a-IZO). Application of these equations suggests that optimal TFT performance is obtained when the channel layer thickness is chosen to be similar to its Debye length. Estimated trap densities of these two AOS TFTs are found to be quite similar. Therefore, the superior mobility performance of the a-IZO TFT compared to the a-IGZO TFT is ascribed to the smaller effective mass of a-IZO, assuming that the maximum (no trapping) drift mobility in the channel is established by the thermally-limited diffusive mobility.

Effect of Gate Dielectric Material on the Electrical Properties of MoSe2-Based Metal–Insulator–Semiconductor Field-Effect Transistor

In this study, we fabricated metal–insulator–semiconductor field-effect transistors (MISFETs) based on nanolayered molybdenum diselenide (MoSe2) using two insulator materials, silicon dioxide (SiO2) and silicon nitride (SiN). We performed morphological and electrical characterizations in which the devices showed good electronic performance, such as high mobility and high Ion/Ioff ratios exceeding 104. The subthreshold swing (ss) was somewhat high in all devices owing to the dimensions of our devices. In addition, the transfer curves showed good controllability as a function of gate voltage. The photogating effect was weakened in MoSe2/SiN/Si, indicating that SiN is a good alternative to silicon oxide as a gate dielectric material.

Thin-film transistor accumulation-mode modeling

Analytical equations are developed for electrostatic assessment of accumulation-mode thin-film transistors (TFTs) so that potential, electric field, and accumulation layer free electron concentration profiles may be generated. Additionally, equations are derived for plotting TFT trap density versus surface potential, based on accurate extraction of the channel mobility as a function of gate voltage. A key factor in formulating these device physics equations is distinguishing between a ‘long-base’ or ‘short-base’ channel thickness. A ‘long-base’ (‘short-base’) channel thickness is defined to occur when the accumulation layer thickness (as calculated in the normal manner) is less than (greater than) the physical thickness of the channel layer. The electrostatic equations derived herein are applied to the analysis of two amorphous oxide semiconductor (AOS) TFTs with differing channel layers, i.e., a 40 nm amorphous indium gallium zinc oxide (a-IGZO) or a 7 nm amorphous indium zinc oxide (a-IZO). Application of these equations suggests that optimal TFT performance is obtained when the channel layer thickness is chosen to be similar to its Debye length. Estimated trap densities of these two AOS TFTs are found to be quite similar. Therefore, the superior mobility performance of the a-IZO TFT compared to the a-IGZO TFT is ascribed to the smaller effective mass of a-IZO, assuming that the maximum (no trapping) drift mobility in the channel is established by the thermally-limited diffusive mobility.

Subthreshold modeling of ambipolar organic field-effect transistor based on field-dependent mobility

In the present work, an ambipolar charge transport model based on the field dependent mobility is presented for the electron accumulation mode. The model is derived using the charge drift approach, which is later extended to include subthreshold ambipolar region, using an asymptotically interpolation function. A methodology for the extraction of model parameters is discussed. The extracted parameters are then used to obtain the field dependent mobility for both holes and electrons. The role of traps in modulating the electron and hole mobility as a function of gate voltage is presented. It is demonstrated that the output and transfer characteristics obtained from the model are in close proximity with the experimental results presented by of Zhang et al. (2017).

Subgap states in superconducting islands

We study an interacting quantum dot in contact with a superconducting island described by the Richardson model with a Coulomb repulsion term controlling the number of electrons on the island. This Hamiltonian admits a compact matrix-product-operator representation and can be efficiently and accurately solved using the density-matrix renormalization group. We systematically explore the effects of the charging energy $E_c$. For $E_c$ comparable to the superconducting gap $\Delta$, the subgap states are stabilized by the combination of Kondo exchange coupling and charge redistribution driven by the Coulomb interaction. The subgap states exist for both even and odd superconductor ground-state occupancy, but with very distinctive excitation spectra in each case. The spectral peaks are not symmetric with respect to the chemical potential and may undergo discontinuous changes as a function of gate voltages.

Electronic properties of InAs/EuS/Al hybrid nanowires

We study the electronic properties of InAs/EuS/Al heterostructures as explored in a recent experiment [S. Vaitiekenas \emph{et al.}, Nat. Phys. (2020)], combining both spectroscopic results and microscopic device simulations. In particular, we use angle-resolved photoemission spectroscopy to investigate the band bending at the InAs/EuS interface. The resulting band offset value serves as an essential input to subsequent microscopic device simulations, allowing us to map the electronic wave function distribution. We conclude that the magnetic proximity effects at the Al/EuS as well as the InAs/EuS interfaces are both essential to achieve topological superconductivity at zero applied magnetic field. Mapping the topological phase diagram as a function of gate voltages and proximity-induced exchange couplings, we show that the ferromagnetic hybrid nanowire with overlapping Al and EuS layers can become a topological superconductor within realistic parameter regimes, and that the topological phase can be optimized by external gating. Our work highlights the need for a combined experimental and theoretical effort for faithful device simulation.

Full parity phase diagram of a proximitized nanowire island

We measure the charge periodicity of Coulomb blockade conductance oscillations of a hybrid InSb-Al island as a function of gate voltage and parallel magnetic field. The periodicity changes from $2e$ to $1e$ at a gate-dependent value of the magnetic field, $B^*$, decreasing from a high to a low limit upon increasing the gate voltage. In the gate voltage region between the two limits, which our numerical simulations indicate to be the most promising for locating Majorana zero modes, we observe correlated oscillations of peak spacings and heights. For positive gate voltages, the $2e$-$1e$ transition with low $B^*$ is due to the presence of non-topological states whose energy quickly disperses below the charging energy due to the orbital effect of the magnetic field. Our measurements demonstrate the importance of a careful exploration of the entire available phase space of a proximitized nanowire as a prerequisite to define future topological qubits.

Metal/ SrTiO3 two-dimensional electron gases for spin-to-charge conversion

SrTiO$_3$-based two-dimensional electron gases (2DEGs) can be formed through the deposition of epitaxial oxides like LaAlO$_3$ or of reactive metals such as Al. Such 2DEGs possess a finite Rashba spin-orbit coupling that has recently been harnessed to interconvert charge and spin currents through the direct and inverse Edelstein and spin Hall effects. Here we compare the formation and properties of 2DEGs generated in SrTiO$_3$ by the growth of Al, Ta and Y ultrathin films by magnetron sputtering. By combining in situ and ex situ X-ray photoelectron spectroscopy (XPS) we gain insight into the reduction of the SrTiO$_3$ and the appearance of Ti$^{3+}$ states associated with 2DEG formation, its reoxidation by exposure to the air, and the transformation of the metal into its binary oxides. We extract the carrier densities through magnetotransport and compare them with the XPS data. Finally, working with samples covered by an extra layer of NiFe, we perform spin-pumping ferromagnetic resonance experiments and investigate spin-charge conversion as a function of gate voltage. We identify trends in the data across the different sample systems and discuss them as a function of the carrier density and the transparency of the metal oxide tunnel barrier.

Gate-tuned anomalous Hall effect driven by Rashba splitting in intermixed LaAlO3/GdTiO3/SrTiO3

The Anomalous Hall Effect (AHE) is an important quantity in determining the properties and understanding the behaviour of the two-dimensional electron system forming at the interface of SrTiO3-based oxide heterostructures. The occurrence of AHE is often interpreted as a signature of ferromagnetism, but it is becoming more and more clear that also paramagnets may contribute to AHE. We studied the influence of magnetic ions by measuring intermixed LaAlO3/GdTiO3/SrTiO3 at temperatures below 10 K. We find that, as function of gate voltage, the system undergoes a Lifshitz transition while at the same time an onset of AHE is observed. However, we do not observe clear signs of ferromagnetism. We argue the AHE to be due to the change in Rashba spin-orbit coupling at the Lifshitz transition and conclude that also paramagnetic moments which are easily polarizable at low temperatures and high magnetic fields lead to the presence of AHE, which needs to be taken into account when extracting carrier densities and mobilities.

Modeling Photodetection at the Graphene/Ag2S Interface

Mixed‐dimensional systems host interesting phenomena that involve electron and ion transport along or across the interface, with promising applications in optoelectronic and electrochemical devices. Herein, a heterosystem consisting of a graphene monolayer with a colloidal Ag2S nanocrystal film atop, in which both ions and electrons are involved in photoelectrical effects, is studied. An investigation of the transport at the interface in different configurations by using a phototransistor configuration with graphene as a charge‐transport layer and semiconductor nanocrystals as a light‐sensitive layer is performed. The key feature of charge transfer is investigated as a function of gate voltage, frequency, and incident light power. A simple analytical model of the photoresponse is developed, to gain information on the device operation, revealing that the nanocrystals transfer electrons to graphene in the dark, but the opposite process occurs upon illumination. A frequency‐dependence analysis suggests a fractal interface between the two materials. This interface can be modified using solid‐state electrochemical reactions, leading to the formation of metallic Ag particles, which affect the graphene properties by additional doping, while keeping the photoresponse. Overall, these results provide analytical tools and guidelines for the evaluation of coupled electron/ion transport in hybrid systems.

Capacitance–Voltage Technique Based on Time Varying Magnetic Field for VDMOSFET—Part I: Concept and Implementation

In this article, we report a new capacitance–voltage technique ${C}$ ( ${V}$ ) to investigate the interface proprieties of MOS devices. This technique is based on surface potential modulation using time varying (ac) magnetic field. It is experimentally validated on vertical double diffusion MOSFET (VDMOSFET). Data show that the surface potential is modulated using external ac magnetic field. In fact, applying an ac magnetic field with dc voltage sweeping of VDMOSFET gate ( ${V}~_{G}$ ), we have been able, for the first time, to modulate the surface potential and measure the gate–source ( ${C} _{\text {GS}}$ ) and gate–drain ( ${C} _{\text {GD}}$ ) capacitances as a function of gate voltage ( ${V}~_{G}$ ) for P- and N-type transistors. Therefore, it offers a powerful tool to characterize different regions of the transistor and extract their technological and electrical parameters.